Analog signal sampling method and sampling device

Abstract

The invention discloses a method for sampling analog signals, comprising: responding to sampling requests for high-frequency analog signals and low-frequency analog signals, simultaneously starting a high-frequency timer and a low-frequency timer to perform timing work; wherein, the high-frequency timer The timing of the timer is cleared from the first timing initial value to the high-frequency timing period and reset from zero; the timing of the low-frequency timer is cleared from the second timing initial value to the low-frequency timing period and restarted from zero Timing; the low-frequency timing period is an integer multiple of the high-frequency timing period, the difference between the first timing initial value and the second timing initial value is greater than zero and is not in multiples of the high-frequency timing period ; When the timing value is detected to be zero, the sampling module is triggered to sample the analog signal. Correspondingly, the invention also discloses an analog signal sampling device. By adopting the embodiments of the present invention, the accuracy of analog signal sampling is improved, and low-frequency sampling is prevented from affecting high-frequency sampling.

Description

technical field [0001] The invention relates to the technical field of analog signal sampling, in particular to an analog signal sampling method and a sampling device. Background technique [0002] In an analog signal circuit, it is often necessary to perform analog signal acquisition on the components on the circuit, also known as AD acquisition. For circuits with multiple AD acquisitions, there are high-frequency signal acquisitions of tens of kHz, low-frequency signal acquisitions of a few kHz, and even temperature acquisitions with a relatively slow acquisition frequency. It cannot be disturbed during high-frequency signal acquisition, even if it is a few hundred nanoseconds of interference, it will cause a large acquisition error. In the prior art, the high-frequency signal collection, low-frequency signal collection and temperature collection are collected according to their respective collection periods, but in some cases, the low-frequency signal collection and temp...

AI Technical Summary

Problems solved by technology

For circuits with multiple AD acquisitions, there are high-frequency signal acquisitions of tens of kHz, low-frequency signal acquisitions of a few kHz, and even temperature acquisitions with slower acquisition frequencies.

It cannot be disturbed during high-frequency signal acquisition, even if it is a few hundred nanoseconds of interference, it will cause a large acquisition error

In the prior art, the high-frequency signal collection, low-frequency signal collection and temperature collection are collected according to their respective collection periods, but in some cases, the low-frequency signal collection and temperature collection will affect the high-frequency signal collection, which will not only make the collection deviate , will also cause spikes in some sampled signals on the control

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