Diamond cutter cutting edge contour quality ultra-precision measurement device

A diamond tool and ultra-precision measurement technology, which is applied in the field of ultra-precision measurement, can solve the problems of affecting the measurement results, difficult adjustment, small operating space of the measurement platform, etc., and achieve the effect of improving the operating space

Pending Publication Date: 2018-03-16
INST OF MACHINERY MFG TECH CHINA ACAD OF ENG PHYSICS
View PDF1 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the above-mentioned announced or published measurement methods are all measured on the existing commercial atomic force microscope (AFM) measurement platform, which has the following shortcomings: the commercial AFM measurement platform has a small operating space, and it is difficult to adjust during the measurement process, resulting in low measurement efficiency; Ultra-precision The rotary shaft system is placed horizontally on the atomic force platform, the vibration and rotation error of the shaft system will significantly affect the measurement results

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Diamond cutter cutting edge contour quality ultra-precision measurement device
  • Diamond cutter cutting edge contour quality ultra-precision measurement device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0020] Such as figure 1 As shown, the diamond tool cutting edge profile quality ultra-precision measuring device of the present invention includes a base 1, a support 2, a beam 3, an atomic force scanning head 4, an atomic force scanning measurement system 5, a left and right moving guide rail A6, an up and down moving guide rail A7, an optical microscope 8. Microscope mounting base 9, up and down moving guide rail B10, left and right moving guide rail B11, three-dimensional precision pose adjustment mechanism 12, ultra-precision aerostatic rotary shaft system 13, front and rear moving guide rail 14;

[0021] The connection relationship is: the base 1 is placed on the vibration isolation foundation; the bracket 2 is fixedly connected to the base 1; the beam 3 is fixedly connected to the bracket 2; the left and right moving guide rail ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a diamond cutter cutting edge contour quality ultra-precision measurement device. A left-right moving guide rail A, an up-and-down moving guide rail A and a front-rear moving guide rail of the device are used for achieving ten-micron eccentric adjustment of an atomic force scanning head and a diamond cutter; a left-right moving guide rail B and a front-rear moving guide rail B are used for achieving ten-micron eccentric adjustment of an optical microscope and the diamond cutter; a three-dimensional precision pose adjusting mechanism is used for achieving submicron eccentric adjustment of the diamond cutter and an atomic force scanning probe; and an ultra-precision air static pressure rotary shaft is used for achieving measurement of a diamond cutter full cutting edge sharpness and arc waviness. The diamond cutter cutting edge contour quality ultra-precision measurement device can effectively control the influence of the vibration of an ultra-precision shaft androtation errors on measurement results, and the diamond cutter cutting edge sharpness, arc waviness, cutting edge micro openings and cutting edge surface roughness measurement efficiency are remarkably improved.

Description

technical field [0001] The invention belongs to the technical field of ultra-precise measurement, and in particular relates to an ultra-precise measurement device for the profile quality of a diamond tool edge. Background technique [0002] As ultra-precision machining is a key technology for modern high-tech warfare, high-tech industry and cutting-edge technology development. For ultra-precision machining, tools that meet certain quality requirements are essential. As the only tool that can meet the requirements of ultra-precision cutting, the evaluation and measurement technology of high-precision diamond tools is an important supporting technology for ultra-precision cutting. The development of its evaluation and measurement can not only provide comprehensive evaluation of tool quality in the process of ultra-precision cutting , Judgment and monitoring provide technical support, and also provide guidance for tool manufacturing technology. Experimental research on ultra-...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01B7/28G01B7/34G01Q60/24
CPCG01B7/28G01B7/34G01Q60/24
Inventor 雷大江崔海龙岳晓斌刘坤雷艳华张新疆蓝河夏欢
Owner INST OF MACHINERY MFG TECH CHINA ACAD OF ENG PHYSICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap