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Film material thermophysical property measurement system and method based on fluorescent lifetime

A technology of fluorescence lifetime and thin-film materials, which is applied in the field of optical measurement of thermal and physical properties of materials, can solve problems such as no relevant reports, and achieve the effects of ensuring biological activity, easier acquisition of signals, and high excitation efficiency

Active Publication Date: 2018-04-13
WUHAN UNIV
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Problems solved by technology

At present, there are many temperature measurement methods based on fluorescence lifetime, but there is no relevant report on the direct measurement and research of thermal physical properties using fluorescence lifetime

Method used

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  • Film material thermophysical property measurement system and method based on fluorescent lifetime
  • Film material thermophysical property measurement system and method based on fluorescent lifetime
  • Film material thermophysical property measurement system and method based on fluorescent lifetime

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specific Embodiment approach

[0044] As a specific implementation, the emitted light from the detection light source 1 sequentially passes through the first light concentrating element 310 and the light splitting element 4, and then irradiates the surface of the film sample 5, and the fluorescent signal generated by the film sample 5 is then sequentially passed through the third light concentrating element. The component 330 and the filter component 6 are received by the photon detector 7 placed near the surface of the thin film sample 5 . The emitted light from the heating light source 2 is irradiated onto the surface of the film sample 5 after passing through the second light concentrating member 320 . Wherein, the first light concentrating element 310 , the second light concentrating element 320 and the third light concentrating element 330 are used to enhance the laser intensity, and the filter element 6 is used to filter stray light. More specifically, the first converging element 310 , the second con...

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Abstract

The invention discloses a film material thermophysical property measurement system and method based on fluorescent lifetime. The film material thermophysical property measurement system comprises a detection light source, a heating light source, a photon detector, a time-correlated single photon counter and a calculation unit; the detection light source is used for irradiating a film sample so asto fluorescently excite the film sample; the heating light source is used for irradiating the film sample so as to instantaneously heat the film sample; the photo detector is used for detecting a fluorescent signal of fluorescence excitation; the time-correlated single photon counter is connected with the photo detector by virtue of the signal and used for recording a single photon signal of the fluorescence excitation; and the calculation unit is connected with the time-correlated single photon counter by virtue of the signal and used for calculating thermophysical properties of the film sample according to the single photon signal recorded by the time-correlated single photon counter. The film material thermophysical property measurement system is simple and easy in operation, flexible in measurement way, higher in sensitivity, applicable to the fields such as biology and medicine, capable of ensuring the biological activity, and capable of measuring the thermophysical properties under the small temperature disturbance.

Description

technical field [0001] The invention belongs to the technical field of optical measurement of thermal physical properties of materials, and in particular relates to a measurement system and method for thermal physical properties of thin film materials based on fluorescence lifetime. Background technique [0002] With the rapid development of thin film material synthesis and processing technology, thin film materials have been widely used in the fields of micromechanics and microelectronic devices. It is of great significance for the research and development of thin film materials to analyze thermal properties and reveal the mechanism of heat transport. However, the methods used to measure and analyze the thermal properties of materials at the macro scale are no longer applicable at the micro-nano scale. The development of new thermal measurement methods for thin film materials has become one of the research hotspots at home and abroad. At present, thermal measurement metho...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/64
CPCG01N21/6402
Inventor 岳亚楠吴昊熊扬恒
Owner WUHAN UNIV
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