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Inspection system, method for controlling inspection device, and computer-readable storage medium

A technology of inspection system and control method, applied in the direction of measuring device, optical device, testing of machine/structural components, etc., can solve the problems of difficulty in confirming settings, inability to carry out such confirmation, information time-consuming and labor-intensive, etc.

Active Publication Date: 2021-05-07
ORMON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the current situation is that even in such a case, it is necessary to reset the inspection standard data from the beginning, and it is not easy to confirm the setting before the change, so there is a problem that it takes time to deal with "false detection"
[0013] In addition, there is a need to retrospectively confirm who, when, and from what point of view and intent set (update) the inspection standard data that caused "false detection" or "missing detection", but there are The problem with the prior art not being able to make such a confirmation
[0014] In addition, when a defective product is found in the subsequent process, it is necessary to confirm the settings when the defective product is missed, and it is necessary to retroactively confirm what items and standards are the cause of the "missed inspection", and use the standard for inspection When is the period, etc., but the current situation is that there is a problem of time-consuming and labor-intensive confirmation of such information

Method used

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  • Inspection system, method for controlling inspection device, and computer-readable storage medium
  • Inspection system, method for controlling inspection device, and computer-readable storage medium
  • Inspection system, method for controlling inspection device, and computer-readable storage medium

Examples

Experimental program
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no. 1 example ＞

[0059] figure 1 An example of the hardware configuration of the substrate inspection system 9 of this embodiment is shown. The board|substrate inspection system 9 of this embodiment is comprised in which the teaching terminal 1, the server 2 for data management, and the board|substrate inspection apparatus 3 are mutually connected via the communication line.

[0060] As the teaching terminal 1, there is typically a stationary terminal including an output unit 101 such as a display monitor, an input unit 102 such as a keyboard and a mouse, a memory 103 such as a RAM, and a processing unit 104 such as a CPU, but it may also be a mobile terminal, a tablet type The terminal may also be configured integrally with the inspection device 3 .

[0061] The teaching terminal 1 is not only applied to the creation of the inspection program used in the inspection device 3 (including corrections, the same below), and the setting of the inspection content data (including changes, the same be...

no. 2 example ＞

[0103] based on Figure 9 ~ Figure 13 Another example of the board|substrate inspection system 9 of this invention is demonstrated. It should be noted that the basic structure of the substrate inspection system 9 of this embodiment is the same as that of the substrate inspection system 9 of the above-mentioned first embodiment, and there are many common parts, so the same reference numerals are assigned to such parts. Description omitted.

[0104] Such as Figure 9 As shown, the substrate inspection system 9 of this embodiment is based on the structure of the substrate inspection device of the first embodiment, and a simulation inspection processing unit 16 is set in the processing unit of the teaching terminal 1 . The function of the simulation inspection processing unit 16 is to perform a simulation inspection on the supplied image data based on the arbitrarily selected revised inspection content data, and to provide the inspection result to the UI control unit 11 .

[01...

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Abstract

The present invention discloses an inspection system, a control method of an inspection device, and a computer-readable storage medium, and provides a technique used in the inspection of articles by which inspection items and / or inspection standard setting contents of each component can be easily confirmed History. The inspection system is an inspection system for inspecting articles mounted with parts, and the inspection is performed using inspection content data and / or inspection programs, the inspection content data including inspection items set for each part number and and / or an inspection standard, the inspection program judges the quality of the substrate based on the inspection content data, and the inspection system includes: a storage unit that stores and maintains the settings of the inspection content data and / or the inspection program at each revision; A processing section that reads the inspection content data and / or the inspection program that are arbitrarily revised from the storage section; and an output section that outputs the read inspection content data and / or inspection program.

Description

technical field [0001] The present invention relates to inspection technology of articles mounted with components. Background technique [0002] An automatic visual inspection device is widely used as a device for inspecting the mounting state of a component on a substrate and the like. In such an apparatus, the sensor acquires appearance information of a substrate on which components are mounted (including a substrate in a state before soldering), and measures items corresponding to the component for each component. Then, check the obtained measured value with the specified standard value to distinguish qualified products from non-conforming products. [0003] Therefore, prior to inspection, it is necessary to set an inspection item and a standard value for the item for each part number, and to register these in a state that an inspection device can refer to. [0004] Here, if the set inspection items and standard values ​​are inappropriate, "false inspection" will occur ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D21/00
CPCG01D21/00G01B11/0608G01M99/00H05K13/0815
Inventor 绀田隆一郎
Owner ORMON CORP