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Test system, test apparatus control method, and computer-readable storage medium

A technology for checking systems and control methods, applied to measuring devices, using optical devices, testing of machine/structural components, etc., can solve the problems of time-consuming and labor-intensive information, difficult confirmation of settings, and inability to perform such confirmations

Active Publication Date: 2018-05-25
ORMON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the current situation is that even in such a case, it is necessary to reset the inspection standard data from the beginning, and it is not easy to confirm the setting before the change, so there is a problem that it takes time to deal with "false detection"
[0013] In addition, there is a need to retrospectively confirm who, when, and from what point of view and intent set (update) the inspection standard data that caused "false detection" or "missing detection", but there are The problem with the prior art not being able to make such a confirmation
[0014] In addition, when a defective product is found in the subsequent process, it is necessary to confirm the settings when the defective product is missed, and it is necessary to retroactively confirm what items and standards are the cause of the "missed inspection", and use the standard for inspection When is the period, etc., but the current situation is that there is a problem of time-consuming and labor-intensive confirmation of such information

Method used

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  • Test system, test apparatus control method, and computer-readable storage medium
  • Test system, test apparatus control method, and computer-readable storage medium
  • Test system, test apparatus control method, and computer-readable storage medium

Examples

Experimental program
Comparison scheme
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no. 1 example ＞

[0059] figure 1 An example of the hardware configuration of the substrate inspection system 9 of this embodiment is shown. The board|substrate inspection system 9 of this embodiment is comprised in which the teaching terminal 1, the server 2 for data management, and the board|substrate inspection apparatus 3 are mutually connected via the communication line.

[0060] As the teaching terminal 1, there is typically a stationary terminal including an output unit 101 such as a display monitor, an input unit 102 such as a keyboard and a mouse, a memory 103 such as a RAM, and a processing unit 104 such as a CPU, but it may also be a mobile terminal, a tablet type The terminal may also be configured integrally with the inspection device 3 .

[0061] The teaching terminal 1 is not only applied to the creation of the inspection program used in the inspection device 3 (including corrections, the same below), and the setting of the inspection content data (including changes, the same be...

no. 2 example ＞

[0103] based on Figure 9 ~ Figure 13 Another example of the board|substrate inspection system 9 of this invention is demonstrated. It should be noted that the basic structure of the substrate inspection system 9 of this embodiment is the same as that of the substrate inspection system 9 of the above-mentioned first embodiment, and there are many common parts, so the same reference numerals are assigned to such parts. Description omitted.

[0104] Such as Figure 9 As shown, the substrate inspection system 9 of this embodiment is based on the structure of the substrate inspection device of the first embodiment, and a simulation inspection processing unit 16 is set in the processing unit of the teaching terminal 1 . The function of the simulation inspection processing unit 16 is to perform a simulation inspection on the supplied image data based on the arbitrarily selected revised inspection content data, and to provide the inspection result to the UI control unit 11 .

[01...

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PUM

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Abstract

The invention discloses a test system, a test apparatus control method, and a computer-readable storage medium. The invention provides technology that makes it easy to verify the history of the content of component-specific testing specifications and / or test standards used for testing products. The inspection system for performing a component-equipped product test, the test being performed usingtest content data including test features and / or test standards specified for respective component part numbers of the components, and / or a test program based on the test content data judges a product quality of a printed circuit board, a memory unit which stores the test content data and / or the test program by revision accumulation, a processing unit configured to read the test content data and / or the test program of a desired revision from the memory unit, and an output unit, which outputs the read test content data and / or the read test program.

Description

technical field [0001] The present invention relates to inspection technology of articles mounted with components. Background technique [0002] An automatic visual inspection device is widely used as a device for inspecting the mounting state of a component on a substrate and the like. In such an apparatus, the sensor acquires appearance information of a substrate on which components are mounted (including a substrate in a state before soldering), and measures items corresponding to the component for each component. Then, check the obtained measured value with the specified standard value to distinguish qualified products from non-conforming products. [0003] Therefore, prior to inspection, it is necessary to set an inspection item and a standard value for the item for each part number, and to register these in a state that an inspection device can refer to. [0004] Here, if the set inspection items and standard values ​​are inappropriate, "false inspection" will occur ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01D21/00
CPCG01D21/00G01B11/0608G01M99/00H05K13/0815
Inventor 绀田隆一郎
Owner ORMON CORP