Step Response Rise Time Test Method Based on Pulse Sequence and Waveform Reconstruction

Abstract

The invention discloses a step response rise time test method based on a pulse sequence and waveform reconstruction. The idea of pulse sequence sending and waveform reconstructing is adopted. First, the time length of a single sent pulse is set as the sampling interval of a test system and is equally divided into N portions, and the pulse sending interval exceeds the sampling interval by one portion so that each sampled pulse can collect different sampling points of a sent pulse. Then, collected data is translated in time to obtain the information of a single sent pulse. Finally, the waveformis reconstructed to restore a complete single sent pulse, and the rise time of step response is calculated. According to the invention, a sent pulse sequence is designed, a collection system is enabled to collect different sampling values, and a complete sent signal is obtained through waveform reconstruction. Therefore, the problem that the information content in collected data is low and the calculated rise time of step response is inaccurate under the condition of insufficient sampling rate is solved, and the calculation accuracy of the rise time of step response is improved.

Description

technical field [0001] The invention relates to a step response rise time test method based on pulse sequence and waveform reconstruction, and belongs to the technical field of DC electronic transformer tests. Background technique [0002] The rise time of the step response test is an important parameter of the DC electronic transformer test, and its test results characterize the transmission response of the DC electronic transformer, which directly affects the operation consistency of the differential protection of the DC transmission system. At present, for the step response test of DC electronic transformers, the collector is generally used to collect different sampling points of the step test, and the step low value (10% of the step amplitude) is calculated by interpolation according to the collection results , the corresponding time of the step high value (90% of the step amplitude), and finally obtain the rise time of the step response test. However, because the trans...

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Problems solved by technology

However, because the transient characteristic time of the step response lasts very short, often only about tens of microseconds, and the sampling rate of protection and measurement and control systems in actual engineering is mostly 10kHz, only one sampling point or even Only the step amplitude can be collected, and using this collected data to calculate and evaluate the transient characteristics of DC electronic transformers will undoubtedly bring a large error, which is also the accurate measurement of the rise time of DC electronic current transformers. a major difficulty

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