Security check system

A technology of security inspection and mounting frame, applied in the field of security inspection system, can solve the problem that the image quality needs to be improved, and achieve the effect of improving the imaging quality

Inactive Publication Date: 2018-11-02
TSINGHUA UNIV +1
View PDF8 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the image quality of the existing backscatter inspection system still needs to be improved

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Security check system
  • Security check system
  • Security check system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. The following description of at least one exemplary embodiment is merely illustrative in nature and in no way taken as limiting the invention, its application or uses. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative work fall within the protection scope of the present invention.

[0032] Techniques, methods and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, such techniques, methods and devices should be considered part of the Authorized Specification.

[0033] In the description of the present invention, it shou...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to the technical field of security check, in particular to a security check system. The provided security check system comprises a back scattering scanning device and a support device, wherein a check channel allowing a checked article to pass is formed by the support device, the back scattering scanning device is arranged at the upper part of the support device and comprisesa back scattering radiation source device and a back scattering detection device, and the support device adjusts the height of the back scattering scanning device. By means of the support device of the security check system, the height of the back scattering scanning device mounted on the support device can be adjusted, the sizes of a flying point light spot projection and the aperture angle areconveniently adjusted according to the height of the checked article in the scanning process, and therefore, the imaging quality of a back scattering image can be effectively improved.

Description

technical field [0001] The invention relates to the technical field of safety inspection, in particular to a safety inspection system. Background technique [0002] The security inspection system is a device that scans and inspects objects such as vehicles, containers, and aircraft to obtain images at customs and airports. From the perspective of imaging principles, security inspection systems can be divided into two categories: transmission imaging and backscatter imaging. Among them, the backscatter imaging technology uses the Compton scattering effect to capture photons reflected by the scanned object for imaging. The scattering image is formed by the ray signal scattered by the object at a certain depth in the direction of the detector. Due to the stronger Compton scattering of rays in low atomic number substances such as explosives and drugs, backscatter imaging technology can distinguish materials and highlight organic substances, which has low radiation dose, sensit...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/203G01N23/20G01N23/20025G01N23/20066G01N23/04
CPCG01N23/04G01N23/20025G01N23/20066G01N23/20083G01N23/203G01V5/0025
Inventor 于昊李营王伟珍宋全伟王东宇迟豪杰李荐民李玉兰宗春光陈志强李元景张丽
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap