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Static memory based on devices with hysteresis

A technology with static memory and hysteresis characteristics, applied in static memory, digital memory information, information storage and other directions, it can solve the problems of operation complexity, power consumption, delay device durability, limiting the wide application of non-volatile memory, etc.

Active Publication Date: 2021-09-24
TSINGHUA UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, non-volatile memory also has many disadvantages, such as operational complexity, power consumption, delay, and device durability, etc., which limit the wide application of non-volatile memory.

Method used

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  • Static memory based on devices with hysteresis
  • Static memory based on devices with hysteresis
  • Static memory based on devices with hysteresis

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Embodiment Construction

[0030] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0031] The unit circuit and array circuit of the static memory based on the device with hysteresis characteristic according to the embodiment of the present invention will be described below with reference to the accompanying drawings. First, the static memory based on the device with hysteresis characteristic according to the embodiment of the present invention will be described with reference to the accompanying drawings unit circuit.

[0032] figure 1 It is a structural schematic diagram of a unit circuit of a static memory b...

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Abstract

The invention discloses a unit circuit and an array circuit of a static memory based on devices with hysteresis characteristics. The unit circuit includes: an information storage module, a write operation module and a read operation module, wherein the information storage module is composed of devices with hysteresis characteristics to store information using the state of the hysteresis characteristics, and includes a write operation terminal and a read operation terminal, And the stored information is allowed to change without external energy input; the write operation module is connected to the write operation terminal to perform write operation on the information stored in the information storage module, and when the stored information does not change, through The continuous control of the write operation terminal prevents the stored information from changing; the read operation module is connected with the read operation terminal to read the state storage information in the information storage module. The invention has the advantages of high integration and high durability, and is a type of memory that can maintain data at low voltage, thereby greatly reducing power consumption and increasing storage density.

Description

technical field [0001] The invention relates to the technical field of low-power storage design and high-integration static storage design, in particular to a static memory based on devices with hysteresis characteristics. Background technique [0002] With the rise of artificial intelligence and big data, the amount of data processing is increasing. A large amount of data requires the support of high-performance memory. The performance of a memory is determined by factors such as its storage capacity, read / write speed, and power consumption, and any lack of performance in any of them will seriously reduce the performance of the system. [0003] SRAM (Static Random Access Memory, Static Random Access Memory) is a random access memory with a special structure. Compared with DRAM (Dynamic Random Access Memory, Dynamic Random Access Memory), SRAM does not need to refresh the circuit, as long as it saves When the power is turned on, the data stored in the SRAM will not be lost...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C11/413G11C11/419
CPCG11C11/413G11C11/419H01L29/516G11C11/223G11C11/2259G11C11/2253G11C11/2273G11C11/2275G11C8/16G11C7/1075H10B51/30G11C11/412H10B10/12H10B10/18
Inventor 李学清钟宏涛杨华中
Owner TSINGHUA UNIV