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A test method for automatic test logic device interface

A technology for automated testing and logic equipment, used in software testing/debugging, error detection/correction, instrumentation, etc.

Active Publication Date: 2022-05-13
广东华晟数据固态存储有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there is no research on the application of Robot Framework in NVMe protocol testing in the prior art, and there is no related research on the development of Robot Framework's underlying software extension library

Method used

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  • A test method for automatic test logic device interface
  • A test method for automatic test logic device interface
  • A test method for automatic test logic device interface

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example

[0077] 1. Host computer environment construction:

[0078] 1) Install Python: run the python 2.7.3 64-bit installer, install with default settings, after the installation is complete, add paths C:\Python27 and C:\Python27\Scripts to the system environment variable PATH;

[0079] 2) Install Robot Framework: decompress the robotframework-3.0 installation package, enter the decompression directory, and execute the installation command python setup.py install under CMD;

[0080] 3) Install wxPython: run wxPython2.8 64-bit installer, install with default settings

[0081] 4) Install robotframework-ride: decompress the installation package of robotframework-ride-1.5.2.1, enter the decompression directory, and execute the installation command python setup.py install under CMD;

[0082] 5) Install pycrypto: Run the pycrypto-2.6 64-bit installer, install with default settings;

[0083] 6) Install paramiko: decompress the installation package of paramiko-1.7.7.1, enter the decompressi...

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Abstract

The invention discloses a test method for an automated test logic device interface, which includes using a keyword-driven test automation framework as a test template to establish a test hierarchical structure; the test automation framework matches test cases according to received test execution parameters; Get the user keyword in the test case; call the test library of the test library layer according to the user keyword; if calling the built-in library, execute the corresponding test process control according to the user keyword; if calling the corresponding test protocol of the NVMe protocol test library, The protocol calls the corresponding test tool in the test machine tool set to perform the test operation and transmit the test result to the NVMe protocol test library; the NVMe protocol test library parses the test result, judges the completion status of the test operation according to the user keyword, and records it in the log. And feed it back to the test automation framework. The invention improves the test efficiency and reduces the test cost.

Description

technical field [0001] The invention relates to the field of logical device interface testing, in particular to a testing method for automatically testing the logical device interface. Background technique [0002] NVMe (Non-Volatile Memory Express) is a logical device interface specification for accessing non-volatile flash media attached through the PCIe bus. It makes full use of the low latency and parallelism of the PCIe channel, reducing the AHCI The high latency brought by the interface greatly improves the read and write performance of the SSD. At present, NVMe solid-state drives are more and more widely used in the fields of enterprises and civilian use, and various SSD manufacturers are gradually increasing their investment in the NVMe field. At present, in the field of NVMe protocol testing, some of them mainly use manual testing. This method: the test cycle is long, the efficiency is low, and the repetitive workload is large, and the test reliability is reduced d...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684G06F11/3692G06F11/3688
Inventor 彭向辉
Owner 广东华晟数据固态存储有限公司