Product defect detection method, device and system
A product defect and defect detection technology, applied in the direction of measuring devices, optical test defects/defects, image enhancement, etc., can solve problems such as shortage of human resources, large demand for manpower, and high labor intensity of manpower inspection
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Embodiment 1
[0033] figure 1 is a block diagram of the hardware configuration of the product defect detection system 100 according to the embodiment of the present invention.
[0034] like figure 1 As shown, the product defect detection system 100 includes an image acquisition device 1000 and a product defect detection device 2000 .
[0035] The image capture device 1000 is used to capture product images, and provide the captured product images to the product defect detection device 2000 .
[0036] The image acquisition device 1000 may be any imaging device capable of taking pictures, such as a camera.
[0037] The product defect detection device 2000 can be any electronic equipment, such as PC, notebook computer, server and so on.
[0038] In this example, refer to figure 1 As shown, the product defect detection device 2000 may include a processor 2100, a memory 2200, an interface device 2300, a communication device 2400, a display device 2500, an input device 2600, a speaker 2700, a ...
Embodiment 2
[0045]In the process of product manufacturing, factors such as the instability of the upstream process, insufficient mechanical positioning accuracy, and the environment in the factory building often cause the produced products to have various forms of defects. Taking wire mesh products as an example, the defect categories of wire mesh products mainly include three types of defects: damage, impurities and double mesh.
[0046] Among them, the damage defect is caused by mesh breakage or mesh deformation, some of which are much larger than the normal mesh area, and some of which are similar to the normal mesh area, but the shape of the mesh area is the same as that of the normal mesh. big different. Impurity defects are caused by excess screen raw materials left on the screen, or floating objects in the factory building scattered on the screen. Impurity defects generally appear in the same black as the screen in the image, because the color of the impurity and the screen in the ...
Embodiment 3
[0063] This embodiment also provides a product defect detection method. In the process of constructing the defective network framework, the classification results in the above step S2100 include:
[0064] The first type of classification result detects the existence of the first type of defect in the product image, and the first type of defect is a defect whose classification accuracy of the classification network for the type of defect is greater than the first threshold;
[0065] The second type of classification result detects that there is a second type of defect in the product image, and the second type of defect is a defect whose classification accuracy of the classification network for the type of defect is not greater than the first threshold;
[0066] The third classification result detects that no defects exist in the product image.
[0067] In some embodiments, the classification results further include: a fourth classification result, where a fourth type of defect...
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