Crater detection method

A detection method and crater technology, applied in semiconductor/solid-state device testing/measurement, electrical components, circuits, etc., can solve problems such as silicon chip damage, inability to monitor crater formation, affecting product quality and reliability, etc.

Inactive Publication Date: 2020-04-28
江阴苏阳电子股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, compared with the gold wire bonding technology, the hardness of pure copper after burning the ball is almost twice as high as that of the gold ball, while the hardness of the palladium-coated copper wire is higher, which reduces the bonding performance of the copper ball
To overcome the problems of high hardness and high yield of copper wire, greater ultrasonic power and bonding pressure are required during bonding, so it is easy to cause damage to the silicon chip and form craters, seriously affecting product quality and reliability
Conventional gold wire pull and gold ball thrust detection methods cannot monitor the formation of craters

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] The invention mainly aims at the bonding process in the chip packaging process, and provides a crater detection method, which can detect the product quality of the bonding process in real time and ensure the reliability of the product. Specific steps are as follows:

[0014] Step 1. Remove the base island from the product after copper wire bonding with a carving knife;

[0015] Step 2. Pour the mixed acid solution into a small beaker. The mass ratio of the solution is pure water: nitric acid: phosphoric acid: acetic acid = 5%: 80%: 5%: 10%, and heat it on the electric heating plate to 80 ° C, then Place the base island for copper wire bonding;

[0016] Step 3. After waiting for about 10 minutes, wash and dry the base islands bonded with copper wires, judge them under a microscope with a power of more than 200 times, take pictures and save them, and record them;

[0017] Step 4. If the crater cannot be judged, use 20% NaOH solution to repeat steps 2 to 3.

[0018] The...

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Abstract

The invention relates to a crater detection method used for detecting the crater of a copper wire product and has very high monitoring frequency during product type, packaging model and production equipment replacement and parameter adjustment. The method has the advantages of repeatability, simplicity and convenience. According to the method of the invention, a mixed acid solution can be repeatedly used, and the mixed acid solution does not need to be prepared every time and can be replaced once a week; few experiment tools are needed to be adopted, probes or knives, microscopes, beakers, pure water and alcohol which are common in a bonding process are adopted; and workers in the bonding process can operate according to procedures as required.

Description

technical field [0001] The invention relates to the chip packaging industry, in particular to the detection of craters introduced into the bonding process of copper wire products. Background technique [0002] The current application hotspots of the semiconductor industry have expanded from the initial computer and communication to consumer electronics, new energy, automotive electronics and other fields. Low cost has always been the core driving factor of the packaging and testing industry downstream of the vertical division of labor. Therefore, in recent years, in addition to technological and product innovations, the semiconductor packaging industry has been constantly seeking technologies with good process performance and low price to replace gold wires, so as to reduce packaging costs and improve reliability. [0003] Because copper wire has good electrical and mechanical properties, it has won the favor of most manufacturers, and began to mass-produce copper wire and ...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): H01L21/66
CPCH01L22/12
Inventor徐志华葛建秋张彦
Owner江阴苏阳电子股份有限公司