Crater detection method
A detection method and crater technology, applied in semiconductor/solid-state device testing/measurement, electrical components, circuits, etc., can solve problems such as silicon chip damage, inability to monitor crater formation, affecting product quality and reliability, etc.
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[0013] The invention mainly aims at the bonding process in the chip packaging process, and provides a crater detection method, which can detect the product quality of the bonding process in real time and ensure the reliability of the product. Specific steps are as follows:
[0014] Step 1. Remove the base island from the product after copper wire bonding with a carving knife;
[0015] Step 2. Pour the mixed acid solution into a small beaker. The mass ratio of the solution is pure water: nitric acid: phosphoric acid: acetic acid = 5%: 80%: 5%: 10%, and heat it on the electric heating plate to 80 ° C, then Place the base island for copper wire bonding;
[0016] Step 3. After waiting for about 10 minutes, wash and dry the base islands bonded with copper wires, judge them under a microscope with a power of more than 200 times, take pictures and save them, and record them;
[0017] Step 4. If the crater cannot be judged, use 20% NaOH solution to repeat steps 2 to 3.
[0018] The...
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