Binary grating image projection reflection suppression method based on high-frequency pattern interference

Abstract

The invention discloses a binary grating image projection reflection suppression method based on high-frequency pattern interference. The method comprises: generating a plurality of high-frequency patterns for light reflection suppression; generating a binary grating for three-dimensional topography measurement, and performing negation operation on the binary grating to generate a reverse binary grating; generating a plurality of coherent binary gratings; taking a plurality of projection images of a coherent binary grating, which are projected by a projector and acquired by a camera, as outputimages, and synthesizing all the output images according to a certain mode to obtain an output image after reflection suppression, namely, obtaining a result after reflection suppression of a binarygrating image to be projected. In the three-dimensional measurement based on the binary grating projection method, wrong measurement results caused by reflection are effectively eliminated, and the three-dimensional topography measurement precision based on the binary grating projection method is improved.

Description

technical field [0001] The invention relates to the field of active three-dimensional shape measurement, and mainly relates to the use of high-frequency pattern interference to remove the reflective areas distributed on the surface of the measured object in reverse engineering based on binary grating projection method, especially to a high-frequency pattern-based Interferometric reflection suppression method for binary raster image projection. Background technique [0002] The binary grating projection method is a structured light 3D measurement technology, which has the advantages of fast measurement speed and high measurement accuracy. In recent years, it has developed into one of the main technologies for structured light 3D measurement. [0003] In the practical application of the binary grating projection method, it is necessary to project a periodically distributed grating field on the measured object, and the shape height of the object is contained in the distribution...

AI Technical Summary

Problems solved by technology

[0006] First, the existing method to avoid the generation of reflective areas is based on reducing the intensity of the grating projection; in actual measurement, reducing the intensity of the grating projection will reduce the quality of the grating field collected by the camera and increase the intensity of the projected grating of the background light. field interference, resulting in the reduction of three-dimensional measurement accuracy; in addition, only by reducing the intensity of the grating projection, it is difficult to suppress the too strong reflection phenomenon, and rely on a more complex fitting algorithm to determine the degree of reduction of the intensity of the grating projection, the efficiency of the method and The convenience of operation needs to be improved;

[0007] Second, the existing method to overcome the influence of the reflective area, because it uses the grating information near the reflective area that is not disturbed by the reflective light as the basis, realizes the estimation and repair of the missing grating information in the reflective area, because the estimation result inevitably has errors, Therefore, while suppressing reflections, the image restoration process may destroy the grating site distribution and introduce additional measurement errors

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