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Infrared detection device and operation method thereof

A technology for infrared detection and tested parts, which is applied in the direction of measuring devices, aircraft component testing, optical testing flaws/defects, etc., and can solve problems such as inconvenient detection

Pending Publication Date: 2020-07-14
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] Non-destructive testing is widely used in the defect detection process of aerospace. When using non-destructive testing devices to detect aircraft, aircraft, and spacecraft, it is inevitable to encounter T-shaped, L-shaped, and U-shaped areas. Surface, inconvenient to detect

Method used

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  • Infrared detection device and operation method thereof
  • Infrared detection device and operation method thereof
  • Infrared detection device and operation method thereof

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Embodiment Construction

[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0035] The purpose of the present invention is to provide an infrared detection device and its operating method, which can successfully complete the defect detection of non-flat areas and simultaneously complete the three-dimensional imaging of defect location when detecting aircraft, aircraft and spacecraft.

[0036] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further d...

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Abstract

The invention discloses an infrared detection device and an operation method thereof, and relates to the field of nondestructive testing. The device comprises an image processing system and a plurality of same splicing original parts, and the adjacent splicing original parts are connected through hinge connecting bodies. Due to the fact that the infrared detection device is connected through the hinge connecting body, the infrared detection device has the flexible structural characteristic. The splicing element comprises a supporting table; and a roller, a thermal excitation source, a probe, adisplacement sensor, a gyroscope and a memory which are mounted on the supporting table; the roller makes contact with the surface of the measured piece. Therefore, by adopting the device and the operation method thereof provided by the invention, when airplanes, aircrafts and spacecrafts are detected, the defect detection of non-flat areas can be smoothly completed, and the three-dimensional imaging of defect positioning can be completed.

Description

technical field [0001] The invention relates to the field of non-destructive testing, in particular to an infrared detection device and an operating method thereof. Background technique [0002] Non-destructive testing is widely used in the defect detection process of aerospace. When using non-destructive testing devices to detect aircraft, aircraft, and spacecraft, it is inevitable to encounter T-shaped, L-shaped, and U-shaped areas. Surface, inconvenient to detect. Contents of the invention [0003] The purpose of the present invention is to provide an infrared detection device and its operating method, which can successfully complete the defect detection of non-flat areas and simultaneously complete the three-dimensional imaging of defect location when detecting aircraft, aircraft and spacecraft. [0004] To achieve the above object, the present invention provides the following scheme: [0005] An infrared detection device, including an image processing system and a p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88B64F5/60G01D21/02G06T7/00G06T17/00
CPCB64F5/60G01D21/02G01N21/8851G01N2021/8887G06T7/0004G06T17/00G06T2207/10048
Inventor 汪子君熊楠菲王栋万李涛
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA