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External plug-in card testing method and system

A test method and technology of add-in cards, applied in software testing/debugging, error detection/correction, instruments, etc., can solve problems such as low test efficiency and incomplete coverage of scenarios of add-in cards, so as to achieve reliable design principles and highlight the essence Sexual characteristics, simple structure effect

Active Publication Date: 2020-11-17
INSPUR SUZHOU INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Existing tests are generally based on experience, select a small number of external card combinations, and test individual ports in sequence, which leads to incomplete coverage of external card combination scenarios and low efficiency for testing one port at a time. The present invention provides A test method and system for an add-in card

Method used

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  • External plug-in card testing method and system
  • External plug-in card testing method and system
  • External plug-in card testing method and system

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Embodiment Construction

[0062]In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention. Key terms appearing in the present invention are explained below.

[0063] Such as figure 1 As shown, the embodiment of the present invention provides a method for testing an add-in card, including the following steps:

[0064] S1: Select the combined configuration of the external card on the storage side, connect the external card accor...

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Abstract

The invention provides an external plug-in card testing method and system, and the method comprises the following steps: S1, selecting the combination configuration of an external plug-in card at a storage end, enabling the external plug-in card to be connected according to the combination configuration of the external plug-in card, enabling all optical ports or network ports to be connected witha cable, and enabling the optical ports or the network ports to be connected with a switch; S2, selecting configuration of slot activation of the external plug-in card on the storage end to activate the slot of the external plug-in card; S3, selecting the port configuration of the external plug-in card running IO, and selecting the port of the external plug-in card to-be-run IO on the activated slot; S4, building an IO test environment; S5, each message being segmented into a plurality of data packets in the host, each data packet corresponding to one path, and read-write IO being issued for testing; and S6, detecting whether the ports corresponding to all the stored paths pass the test or not, and if so, executing S7: sequentially executing the test of finishing the port configuration ofIO running of the external plug-in card, the configuration of slot activation of the external plug-in card on the storage end and the combined configuration of the external plug-in card on the storage.

Description

technical field [0001] The invention relates to the technical field of storage device external card testing, in particular to an external card testing method and system. Background technique [0002] The current storage device supports 12 external card slots, and supports more than 10 types of external cards. Different external cards can be combined with each other. The same external card and the same slot can choose different IO ports. It is expected that there will be 10W or more external card combination scenario. In different combinations of external cards, there may be failures at the ports of the external cards. This requires a comprehensive test of various combinations of external cards during product testing to ensure high reliability of the product. [0003] Existing tests are generally based on experience, select a small number of external card combinations, and test individual ports sequentially, which leads to incomplete coverage of external card combination sce...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F16/21
CPCG06F11/3676G06F11/3688G06F16/211
Inventor 李超
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD
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