Electronic product click test device capable of automatically adjusting stations
An electronic product and automatic adjustment technology, which is applied in the direction of measuring devices, testing of mechanical components, testing of machine/structural components, etc., can solve the problem of inflexible handling of products with offsets between test buttons and click blocks, and different button strokes. Affect test results and test data to achieve the effect of improving reliability and increasing the range of products used
Inactive Publication Date: 2021-07-02
上海堃囷电子科技有限公司
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Problems solved by technology
[0003] For the traditional click test device for electronic products, after the station is set, the test button and the click block will be offset due to the long-term work of the device, which will affect the test effect and test data. At the same time, the traditional click test device, often Only one product can be tested, and it cannot be flexibly handled for products with different key strokes
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[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0026] see Figure 1-4 , a click test device for electronic products that automatically adjusts stations, including a housing 1, the inner wall of the housing 1 is fixedly connected with slide rails 2, the number of slide rails 2 is four, and two pairs are distributed on the left and right sides of the housing 1 On the inner wall of the slide rail 2, the upper end of the slide rail 2 is fixedly connected with the limit block 3, and the right end of the slide r...
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The invention relates to the field of electronic products, and discloses an electronic product click test device capable of automatically adjusting stations. The device comprises a shell, the inner wall of the shell is fixedly connected with a sliding rail, the upper end of the sliding rail is fixedly connected with a limiting block, the right end of the sliding rail is movably connected with a sliding block, the right end of the sliding block is fixedly connected with a suspension beam, a fixing pin is movably connected to the left side of the suspension beam, a lifting plate is fixedly connected to the right end of the fixing pin, a gear is movably connected to the left end of the lifting plate, a reciprocating rod is movably connected to the left end of the gear, a mounting plate is movably connected to the lower end of the reciprocating rod, and a rotating shaft is movably connected to the middle of the mounting plate; according to the device, the position of the click block is changed through the spring to influence the air pressure in the air cavity of the working block, so that the pressure in the movable groove is changed, the position of the working table is adjusted, a good click test effect is kept, and the reliability of test data is improved.
Description
technical field [0001] The invention relates to the field of electronic products, in particular to a click test device for electronic products that automatically adjusts stations. Background technique [0002] With the development of science and technology, a large number of electronic products come out frequently. At the same time, the button design of electronic products needs to be clicked and tested when it is officially used. However, the click test device will appear to be misaligned with the clicked block during long-term work. Therefore, the intelligent manufacturing design of the click test device is particularly important. [0003] For the traditional click test device for electronic products, after the station is set, the test button and the click block will be offset due to the long-term work of the device, which will affect the test effect and test data. At the same time, the traditional click test device, often Only one product can be tested, and it cannot be ...
Claims
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IPC IPC(8): G01R31/00G01M13/00
CPCG01M13/00G01R31/00
Inventor 郭美华
Owner 上海堃囷电子科技有限公司