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Method, system and computer programming product for memory repair

A memory and memory testing technology, applied in the field of memory repair

Pending Publication Date: 2021-08-06
TAIWAN SEMICON MFG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Determine whether a constraint satisfaction problem involving multiple constraints can be solved

Method used

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  • Method, system and computer programming product for memory repair
  • Method, system and computer programming product for memory repair
  • Method, system and computer programming product for memory repair

Examples

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Embodiment Construction

[0053] The following disclosure provides many different embodiments, or examples, for implementing different features of the presented subject matter. Specific examples of components, materials, values, steps, operations, materials, arrangements, etc. are set forth below to simplify embodiments of the invention. Of course, these are examples only and are not intended to be limiting. Other components, values, operations, materials, arrangements, etc. are contemplated. For example, the description below that a first feature is formed "on" a second feature or "on" a second feature may include embodiments in which the first and second features are formed in direct contact, and may also include Embodiments wherein an additional feature may be formed between a first feature and a second feature such that the first feature and the second feature may not be in direct contact. In addition, the embodiments of the present invention may reuse reference symbols and / or letters in various ...

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Abstract

A method, a system, and a computer programming product for memory repair. The method comprises: extracting a location of at least one fail bit to be repaired in a memory block of memory from at least one memory test performed on the memory block; obtaining available repair resources in the memory for repairing the memory block; judging whether a constraint satisfaction problem including a plurality of constraints can be solved or not, the constraint corresponding to a location of the at least one fail bit in the memory block and an available repair resource; responsive to determining that the constraint satisfaction problem is not resolvable, marking the memory block as an irreparable or rejected memory; in response to determining that the constraint fulfillment problem can be solved and there is a solution to fulfill the constraint, repairing the at least one fail bit using available repair resources according to the solution to the constraint fulfillment problem.

Description

technical field [0001] Embodiments of the invention relate to a method, system and computer programming product for memory repair. Background technique [0002] Memory is a component of electronic devices. Since a defect in the memory could potentially affect not only the performance and / or functionality of the defective memory, but also the performance and / or functionality, so memory quality is a consideration. Memory test and repair is a technique developed to address this consideration. Contents of the invention [0003] The method in the embodiment of the present invention is at least partially executed by a processor. The method includes, but is not limited to, the step of extracting, from at least one memory test performed on a memory bank of said memory bank, the location of at least one failed bit to be repaired in said memory bank. Available repair resources in the memory for repairing the memory block are obtained. Determine whether a constraint satisfaction...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/44G11C29/36G11C29/56G11C29/00
CPCG11C29/4401G11C29/36G11C29/56008G11C29/56016G11C29/56004G11C29/72G11C2029/4402G11C2029/3602G11C29/1201G11C29/816G11C29/835G11C29/808G11C29/24G11C29/42G11C29/44G11C2029/1202G11C2029/1204
Inventor 姜慧如黄健豪吴正一林仲德
Owner TAIWAN SEMICON MFG CO LTD
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