A device testing method, device and electronic device

A technology for equipment testing and equipment under test, which is applied to safety communication devices, electrical components, digital transmission systems, etc., can solve problems such as inconsistency and low accuracy of data buried point testing, and achieve the effect of avoiding low accuracy

Active Publication Date: 2022-07-26
HUNAN HAPPLY SUNSHINE INTERACTIVE ENTERTAINMENT MEDIA CO LTD
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  • Application Information

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Problems solved by technology

[0004] In view of this, the present invention provides an equipment testing method, device, and electronic equipment to solve the situation that when the data link is abnormal, the data collected through the data buried point method is inconsistent with the standard data. At this time, the data buried point is considered to be There is an abnormality in the method, which makes the accuracy of the data buried point test low

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  • A device testing method, device and electronic device
  • A device testing method, device and electronic device
  • A device testing method, device and electronic device

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Embodiment Construction

[0059] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0060] In the process of data burying test, when the data link is abnormal, the data collected by the data burying method will be inconsistent with the standard data. At this time, it is considered that the data burying method is abnormal, but the data burying will appear. There are two reasons for the inconsistency between the data collected by the method and the standard data. One is that there is a problem with the data embedding m...

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Abstract

The present invention provides a device testing method, device and electronic device. A server simulates an abnormal data link corresponding to a data link abnormality identifier, and buries the data link based on the buried point data and a preset standard corresponding to the data link abnormality identifier. The comparison results of the point data are obtained to obtain the data buried point test results. That is, when simulating a data link abnormality scenario, the present invention verifies whether the data embedding method is normal by whether the result fed back by the server is the preset standard data corresponding to the data link abnormality identifier. Since the present invention directly performs the data burying test under the abnormal data link scenario, the problem of low accuracy of the data burying test caused by the abnormal data link can be avoided.

Description

technical field [0001] The present invention relates to the field of testing, and more particularly, to a device testing method, device and electronic device. Background technique [0002] Data burying is a good way of privatized deployment data collection. Before the data buried point is used, it is necessary to test the data buried point. The specific test process is as follows: collect the data collected by the data buried point method, compare the data with the corresponding standard data, and obtain the data buried point according to the comparison result. Point-wise test results. [0003] In the process of data embedding test, when the data link is abnormal, the data collected by the data embedding method will be inconsistent with the standard data. At this time, it is considered that the data embedding method is abnormal, and misjudgment will occur. , which makes the data buried point test accuracy low. SUMMARY OF THE INVENTION [0004] In view of this, the prese...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L43/0817H04L43/00H04L41/14H04L9/40H04B17/30
CPCH04L43/0817H04L43/14H04L41/145H04L63/304H04B17/30
Inventor 卢晓林黄赞群陈果
Owner HUNAN HAPPLY SUNSHINE INTERACTIVE ENTERTAINMENT MEDIA CO LTD
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