Polarization spectrum measuring device

A measurement device and polarization spectrum technology, applied in polarization spectrum, measurement device, optical radiation measurement, etc., can solve the problems of inability to obtain information in real time, slow test, and reduce the stability of the test system, achieve simple structure, ensure accuracy and The effect of stability and wide application prospects

Pending Publication Date: 2022-07-12
NANJING UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

It can be seen that the current characterization method requires multi-step operations, making the test slow and unable to obtain information in real time, and it also needs to frequently touch the components in the optical path, which will reduce the stability of the test system

Method used

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  • Polarization spectrum measuring device
  • Polarization spectrum measuring device
  • Polarization spectrum measuring device

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Embodiment Construction

[0029] The present invention will be described in detail below with reference to the accompanying drawings. It should be understood that the following specific embodiments are only used to illustrate the present invention and not to limit the scope of the present invention.

[0030] see figure 1 , figure 2 , image 3 In this embodiment, a polarization spectrum measurement device includes signal light 1 , an incident slit 2 , a coupling element 3 , a dispersion element 4 , a focusing element 5 , and a detection device 6 . The coupling element 3 is used to collect the optical signal and convert it into a light beam. If it has focusing ability, the focusing element 5 can be removed.

[0031] According to the different modes of action of the light beam and the dispersive element 4, it is divided into transmission type, refraction type and reflection type spectrometer. See figure 1 , in the transmission spectrometer, the signal light 1 transmits through the dispersive element...

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Abstract

The invention discloses a polarization spectrum measuring device. The device comprises an entrance slit, a coupling element, a dispersion element and detection equipment, signal light generated by a sample to be detected spontaneously or stimulated passes through the entrance slit and then is collected by the coupling element, the coupling element transmits a light beam to the dispersion element to be dispersed into multiple beams of dispersion light, the dispersion element is used for separating the polarization correlation quantity of the light beam into different diffraction orders, and the detection equipment is used for detecting the polarization correlation quantity of the light beam. And then detecting multiple beams of dispersion light by a detection device to directly obtain the polarization spectrum of the sample to be detected. Spectrometers with different light path forms can be built by regulating and controlling the positions of the light beams and the dispersion elements, and the spectrometers comprise a transmission type, a refraction type and a reflection type. Through regulation and control of a light source and selection of detection information, the spectrograph can realize detection of absorption, scattering, emission, Raman and other spectrums in ultraviolet, visible and infrared bands, and has the advantages of quickly, stably, simply and efficiently obtaining spectrum information and the like.

Description

technical field [0001] The invention relates to the technical field of spectral analysis instruments, in particular to a polarization spectrum measuring device. Background technique [0002] Spectroscopy is one of the most widely used optical means to study the structure, orientation, chirality and other information of molecules and materials. With the rise of plasmonic photonics and other fields and the maturity of preparation technology, people have prepared a variety of artificial molecules and structures, which have derived a large number of detection requirements, how to quickly and efficiently collect spectra and accurately Obtaining structural information becomes a central problem in this field. [0003] In essence, any photonic technology is to perform a variety of regulation on various physical parameters of the light field, including frequency, wavelength, time, amplitude, phase, polarization, etc., so as to realize the loading, processing and extraction of optica...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/447G01J3/02G01J3/18G01J3/12
CPCG01J3/447G01J3/0208G01J3/0224G01J3/18G01J2003/1291
Inventor 张伟华余颖
Owner NANJING UNIV
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