Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Embedded system memory write-overflow detection method and system

An embedded system and detection method technology, applied in the field of memory management, can solve problems such as unusable, difficult to find and locate, high memory overhead, etc., to achieve the effect of increasing application time, reasonable memory overhead, and avoiding impact

Inactive Publication Date: 2008-03-19
ZTE CORP
View PDF0 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Memory write out of bounds may cause serious problems. Because adjacent memory data is destroyed, other functions or tasks of the program may have unpredictable consequences during execution, resulting in system exceptions and serious impact.
[0003] Memory write out of bounds is a very common type of problem in embedded systems. Once this problem exists, it often has different abnormal performances. It is generally difficult to find and locate, and find out the cause of write out of bounds
[0004] At present, software tools are generally used to detect memory write out of bounds, but this has several shortcomings
First, the memory overhead of these tools is relatively large
Second, these tools can generally only be used during the testing phase of the application, and cannot be used when the application is released to run on the communication device
However, some memory writes out of bounds are difficult to find during the test phase, and often only appear in actual use, which makes it impossible to detect all memory writes out of bounds

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Embedded system memory write-overflow detection method and system
  • Embedded system memory write-overflow detection method and system
  • Embedded system memory write-overflow detection method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] With the detection method of the embedded system memory that the device provided by the present invention realizes to write out of bounds, its steps are as follows: (a) define and detect the memory size; Place the detection memory at the place, and set the initial value of the content in the detection memory; (c) when performing memory write out-of-bounds detection, compare whether the value in the detection memory is equal to the initial value, and if not equal, judge the limit of memory write out-of-bounds . Through the above-mentioned steps and measures of the present invention, it is possible to detect and locate in time after a write out-of-bounds error occurs in the allocated memory block, so that unpredictable results can be avoided in the user system.

[0031] The technical scheme of the method of the present invention will be described in detail below in conjunction with the embodiments and accompanying drawings.

[0032] As shown in Figure 1 is the flow chart...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a detection method for the memory write-overflow of an embedded system, and has the procedures that: (a) the size of the detected memory is defined; (b) when allocating a memory block, a detected memory is arranged at the high address labored to the memory block, and the initial value of the content in the detected memory is established; (c) when performing the detection of the write-overflow of the memory, the value in the detected memory is compared with the initial value; when the value in the detected memory is not equal to the initial value, the memory write-overflow is judged to exist. The present invention can dynamically detect the memory write-overflow of the system in time and can position memory write-overflow to the file name and the line number applied for the memory, thereby being greatly convenient for the developer to find out the reasons of the memory write-overflow. At the same time, the present invention also has the memory protection function, and is not only applied to the test stage of the equipment, but also is applied to the application stage of the equipment.

Description

technical field [0001] The invention relates to the memory management technology of an embedded system, in particular to a detection method and system for memory writing out of bounds in the embedded system. Background technique [0002] Generally, an embedded system runs in a communication device, and the system can access a linear memory address space, that is, any program in the system can read or write to any memory of the system. This makes the memory data between tasks in the embedded system can be accessed freely, so it is possible to destroy the memory data of this task and other tasks by writing out of the memory block. Memory write out of bounds may cause serious problems. Because adjacent memory data is destroyed, other functions or tasks of the program may have unpredictable consequences during execution, resulting in system exceptions and serious impacts. [0003] Memory write out of bounds is a very common type of problem in embedded systems. Once this problem...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 黄海伦
Owner ZTE CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products