Multichannel low-stray-light spectrograph based on area array detector

Abstract

The invention relates to a multichannel low-stray-light spectrograph based on an area array detector, belonging to the field of spectral analysis instruments. The spectrograph comprises an optical platform and a light signal acquisition device, and is characterized in that the area array detector serves as the optical platform; a plurality of band-rejection filters are processed and formed along the spectrum distribution direction on the window of one channel by using an imaging film-coating method; the condition of the change of the stray light received by each area of the detector is measured in real time; and by using the channel as a reference channel, the stray light of the whole spectral analysis instrument is efficiently corrected in real time. By using the spectrograph provided by the invention, the measured stray light in a full-wave band scope of a spectral analysis system is efficiently corrected. The multichannel low-stray-light spectrograph can be applied to measuring various photo-chromic parameters, such as spectrum characteristics, absorbance value, and the like of a to-be-measured sample.

Description

technical field [0001] The invention belongs to the field of spectral analysis instruments, in particular to a multi-channel low stray light spectrometer based on an area array detector. Background technique [0002] Spectroscopic instruments have become the basic equipment for measuring and analyzing the structure and composition of substances, and are widely used in metallurgy, geology, petrochemical, medical and health, environmental protection and other fields. Indispensable remote sensing equipment. Stray light is an important key technical indicator of spectral analysis instruments, and is the main source of error in photometric analysis. It directly determines the working reliability and detection sensitivity of the instrument. Excessive stray light will not only submerge small absorption peaks, but also cause spectrogram The continuous roughness of the lines will also reduce the metering accuracy of the instrument. [0003] The impact of stray light on spectrometer...

AI Technical Summary

Problems solved by technology

Applying this method to correct stray light requires a tunable laser to measure the SSF at each wavelength point of the spectrometer. Since the tunable laser itself is expensive, and the wavelength adjustable range must cover the entire measurable wavelength range of the spectrometer, the implementation cost is very high. , the workload of measurement is very large

And the SSF measurement wavelength range can only reach the measurable wavelength range of the spectrometer, stray light outside this range cannot be corrected

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