Dynamic test device and system of radio-frequency front-end chip

Abstract

The embodiment of the invention discloses a dynamic test device and system of a radio-frequency front-end chip. The system comprises a host computer and a dynamic test device, wherein the host computer is used for editing and storing control sequences of all required test items for the dynamic test; during the dynamic test process, a control sequence corresponding to the current test item is transmitted to the dynamic test device; the dynamic test device is used for receiving and storing the control sequence transmitted by the host computer and corresponding to the current test item; a corresponding control order is sequentially scheduled according to an execution time of each control order in the control sequence corresponding to the current test item to be transmitted to a tested radio-frequency front-end chip. By adopting the embodiment, the radio-frequency front-end chip can be separated from a baseband chip, and the dynamic performance of the radio-frequency front-end chip can be independently tested; and the device and the system are high in flexibility, and the efficiency and effect on testing the dynamic performances of the radio-frequency front-end chip can be greatly improved.

Description

technical field [0001] The invention relates to the technical field of mobile communication, in particular to a dynamic testing device and system for a radio frequency front-end chip. Background technique [0002] Both RF front-end chips and baseband chips are the core components of mobile terminals. Among them, the baseband chip is used to synthesize the baseband signal to be transmitted, or to decode the received baseband signal; the baseband signal refers to the original electrical signal sent by the source without modulation. The radio frequency front-end chip is responsible for radio frequency transmission and reception; specifically, when transmitting, the baseband signal transmitted from the baseband chip is modulated to a higher frequency suitable for antenna transmission through up-conversion, and wirelessly transmitted through the antenna; when receiving, The radio frequency signal received from the antenna is converted into a baseband signal through down-conversi...

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Problems solved by technology

[0006] Moreover, in the prior art, the dynamic performance test of the RF front-end chip can only be performed by relying on the baseband chip, so that the test progress is subject to the progress of the baseband chip, which is not conducive to the development and launch of the RF front-end chip.

[0007] It can be seen that the existing RF front-end chip dynamic performance testing technology, its testing process is time-consuming, complex and not universal, so that testers need to spend a lot of time to modify the test platform, affecting the efficiency and effect of the test

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