Automatic signal delay compensation method and system suitable for radiation effect test
An automatic compensation and signal delay technology, applied in the direction of single semiconductor device testing, measuring electricity, measuring devices, etc., can solve problems such as inaccurate data testing, and achieve the effect of avoiding on-site debugging and having self-adaptive capabilities
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[0030] Such as figure 1 As shown, the hardware modules of an automatic signal delay compensation method suitable for radiation effect testing in the present invention include a clock phase adjustment module 1 , a check vector generation module 2 , and a delay compensation judgment module 3 .
[0031] The clock phase adjustment module must be able to continuously adjust the phase of the sampling clock, and the adjustment range of the sampling clock phase of the clock phase adjustment module is -359 degrees to 359 degrees. There will be a certain delay after the output data of the device under test passes through a certain data transmission line. At this time, if the system clock is used to collect data, it may not be possible to ensure that the signal has sufficient setup time and hold time, resulting in instability of the test data. Using this module, a sampling clock with a certain phase shift relative to the system clock can be generated to ensure that the data has sufficie...
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