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Automatic signal delay compensation method and system suitable for radiation effect test

An automatic compensation and signal delay technology, applied in the direction of single semiconductor device testing, measuring electricity, measuring devices, etc., can solve problems such as inaccurate data testing, and achieve the effect of avoiding on-site debugging and having self-adaptive capabilities

Active Publication Date: 2015-01-28
NORTHWEST INST OF NUCLEAR TECH
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Problems solved by technology

[0006] The purpose of the present invention is to provide a signal delay automatic compensation method and system suitable for radiation effect testing, which solves the technical problem of inaccurate data testing caused by data transmission lines in the radiation effect test environment in existing methods, and can automatically solve the radiation effect The signal delay problem caused by long-term transmission in the test avoids the on-site debugging of the test system in the radiation environment caused by long-term data transmission, and realizes the self-adaptability of the test system to different test environments

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  • Automatic signal delay compensation method and system suitable for radiation effect test
  • Automatic signal delay compensation method and system suitable for radiation effect test
  • Automatic signal delay compensation method and system suitable for radiation effect test

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Embodiment Construction

[0030] Such as figure 1 As shown, the hardware modules of an automatic signal delay compensation method suitable for radiation effect testing in the present invention include a clock phase adjustment module 1 , a check vector generation module 2 , and a delay compensation judgment module 3 .

[0031] The clock phase adjustment module must be able to continuously adjust the phase of the sampling clock, and the adjustment range of the sampling clock phase of the clock phase adjustment module is -359 degrees to 359 degrees. There will be a certain delay after the output data of the device under test passes through a certain data transmission line. At this time, if the system clock is used to collect data, it may not be possible to ensure that the signal has sufficient setup time and hold time, resulting in instability of the test data. Using this module, a sampling clock with a certain phase shift relative to the system clock can be generated to ensure that the data has sufficie...

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Abstract

The invention relates to an automatic signal delay compensation method and system suitable for a radiation effect test. The system provided by the invention comprises a clock phase adjusting module, a verification vector generation module and a delay compensation judgment module. According to the method provided by the invention, signals in long-line transmission are acquired by adopting a clock capable of adjusting phase, the phase of the sampling clock is adjusted to the degree that the signals have enough leading edge margin and lagging edge margin, the signals in long-line transmission can be accurately acquired, and signals synchronous with a system clock can be obtained by acquiring the signals (acquired by the sampling clock) by the system clock. According to the invention, the signal delay problem caused by long-line transmission in the radiation effect test can be solved, field debugging of the test system in a radiation environment caused by long-line data transmission can be avoided, and the test system has adaptive capability for different test environments.

Description

technical field [0001] The present invention relates to a signal delay automatic calibration method and system suitable for radiation effect testing, in particular to a method and system for realizing automatic compensation of data collection delay in radiation effect assessment under different radiation environments, which can be applied to aerospace, Assessment and testing of radiation effects of military electronic components. Background technique [0002] With the development of science and technology, especially the development of space technology and nuclear energy technology, more and more electronic devices have to be applied in various radiation environments. The basic composition of electronic equipment-semiconductor devices are the most sensitive and weakest link to radiation. The radiation damage of semiconductor devices is an important reason for reducing the reliability of spacecraft. The problem that must be solved. [0003] The radiation effect test based o...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01R31/00
Inventor 张科营张凤祁罗尹虹郭红霞姚志斌王园明郭晓强王忠明闫逸华丁李丽赵雯王燕萍
Owner NORTHWEST INST OF NUCLEAR TECH
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