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System for testing high-temperature spectral emissivity of materials based on effective radiation

A technology of spectral emissivity and testing system, which is applied in the field of material high temperature spectral emissivity testing system, can solve the problems of easy oxidation of test samples, high difficulty of testing, and low precision, so as to reduce the difficulty of testing, improve the accuracy of testing, and avoid high temperature oxidation Effect

Active Publication Date: 2013-07-10
TSINGHUA UNIV
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Problems solved by technology

[0008] The purpose of the present invention is to solve the problems of high test difficulty, low precision and easy oxidation of test samples in the existing spectral emissivity test technology

Method used

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  • System for testing high-temperature spectral emissivity of materials based on effective radiation
  • System for testing high-temperature spectral emissivity of materials based on effective radiation

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Embodiment Construction

[0025] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0026] Such as figure 1 As shown, the high-temperature spectral emissivity test system for materials based on effective radiation provided by the present invention includes a water-cooled vacuum chamber 1, a vacuum radiation heating unit, an effective radiation cavity 5 and a radiation measurement and calibration unit, and the vacuum radiation heating unit is fixedly arranged in a water-cooled vacuum In the chamber 1, the effective radiation cavity 5 is movably arranged on one side of the vacuum radiation heating unit, the sample 4 to be tested is arranged between the vacuum radiation heating unit and the effective radiation cavity 5, and the effective radiation cavity 5 is c...

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Abstract

The invention relates to the technical field of thermophysical parameter test on materials, and particularly relates to a system for testing the high-temperature spectral emissivity of materials based on effective radiation. The system comprises a water-cooling vacuum chamber, a vacuum radiation heating unit, an effective radiation cavity and a radiation measurement and calibration unit, the test on the spectral emissivity of materials is performed through the combination of the water-cooling vacuum chamber, the vacuum radiation heating unit, the effective radiation cavity and the radiation measurement and calibration unit, in the process of testing, a blackbody origin is not required to be referenced, and the temperature of materials is not required to be known precisely, thereby reducing the testing difficulty and improving the testing precision; and through placing test samples in the water-cooling vacuum chamber, the high-temperature oxidation problem of test samples is avoided.

Description

technical field [0001] The invention relates to the technical field of thermal physical parameter testing of materials, in particular to a high-temperature spectral emissivity testing system for materials based on effective radiation. Background technique [0002] Spectral emissivity is one of the important thermophysical parameters of materials, which characterizes the spectral radiation ability of the material surface, and is an important basic physical property data for radiation temperature measurement and radiation heat transfer analysis. For example, in aerospace, petrochemical, metallurgy, steel, cement, glass energy and power and other industrial fields, radiation temperature measurement is an effective means to solve high temperature temperature diagnosis in the production process. However, the unknown high temperature spectral emissivity makes the radiation temperature accurate The main obstacle to measurement. Spectral emissivity is complexly related to many fact...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/25G01N21/35G01N21/359
Inventor 符泰然段明皓宗安州
Owner TSINGHUA UNIV
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