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A Non-Uniformity Correction Method for Uncooled Infrared Focal Plane Array

A technology of non-uniformity correction and focal plane array, which is applied in radiation pyrometry, measuring devices, instruments, etc., and can solve problems affecting continuous observation

Active Publication Date: 2016-02-03
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This frequent shutter correction seriously affects the continuous observation of infrared targets by the infrared imaging system

Method used

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  • A Non-Uniformity Correction Method for Uncooled Infrared Focal Plane Array
  • A Non-Uniformity Correction Method for Uncooled Infrared Focal Plane Array

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Embodiment Construction

[0028] Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0029] figure 1 It is a schematic flowchart of a method for correcting non-uniformity of an uncooled infrared focal plane array according to an embodiment of the present invention. Such as figure 1 As shown, in this embodiment, the non-uniformity correction method of the uncooled infrared focal plane array includes step 10, step 12, step 14 and step 16. Each step in the method will be described in detail below with reference to the accompanying drawings.

[0030] Step 10: Calibrate and store the correction parameters.

[0031] In the embodiment of the present invention, firstly, the infrared focal plane array of the infrared imaging system is calibrated, the correction parameters of the infrared focal plane array at each calibration working temperature are obtained, and then these correction parameters are stored in the memory of the infrared imaging ...

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Abstract

The embodiment of the present invention discloses a non-uniformity correction method for an uncooled infrared focal plane array, which includes calculating correction parameters of the infrared focal plane array at at least two calibrated operating temperatures and storing them in a memory; measuring the infrared focal plane The substrate temperature of the array; according to the substrate temperature, the current correction parameter corresponding to the substrate temperature is obtained from the memory; and the infrared image is corrected with the current correction parameter. In the method of the present invention, since the correction parameters of the infrared focal plane array are stored at each calibration working temperature, when the infrared focal plane array is working, it is not necessary to perform a little correction on the infrared focal plane array, and the infrared focal plane array is directly read from the system memory. The correction parameters corresponding to the current working temperature of the focal plane array ensure that the infrared imaging system realizes uninterrupted real-time imaging of infrared targets.

Description

technical field [0001] The invention relates to the field of infrared imaging systems, in particular to a method for correcting non-uniformity of an uncooled infrared focal plane array. Background technique [0002] Infrared focal plane arrays were developed in the late 1970s and early 1980s, driven by defense applications and other strategic and tactical applications. It is an important optoelectronic device to obtain the infrared thermal radiation information of the scene. Infrared focal plane array is the core component of infrared imaging technology, widely used in military, industrial, agricultural, medical, forest fire prevention and other fields of imaging. [0003] Infrared imaging system is an important part of infrared thermal imaging system. At present, various infrared imaging systems have been widely used in communication, medical, military, industrial and other fields. [0004] Infrared focal plane array belongs to the second-generation infrared imaging devi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00
Inventor 郑兴李宵马宣章翔刘子骥
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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