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Non-uniformity correction method for non-refrigeration infrared focal plane array

A non-uniformity correction, focal plane array technology, applied in radiation pyrometry, measuring devices, instruments, etc., can solve problems such as affecting continuous observation

Active Publication Date: 2013-09-18
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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  • Description
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Problems solved by technology

This frequent shutter correction seriously affects the continuous observation of infrared targets by the infrared imaging system

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  • Non-uniformity correction method for non-refrigeration infrared focal plane array
  • Non-uniformity correction method for non-refrigeration infrared focal plane array

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Embodiment Construction

[0028] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

[0029] figure 1 It is a schematic flowchart of a non-uniformity correction method for an uncooled infrared focal plane array according to an embodiment of the present invention. Such as figure 1 As shown, in this embodiment, the non-uniformity correction method of the uncooled infrared focal plane array includes step 10, step 12, step 14 and step 16. The steps in the method will be described in detail below in conjunction with the drawings.

[0030] Step 10: Calibrate and store calibration parameters.

[0031] In the embodiment of the present invention, the infrared focal plane array of the infrared imaging system is first calibrated to obtain the correction parameters of the infrared focal plane array at each calibration working temperature, and then these correction parameters are stored in the memory of the infrared imaging system. It can be called as needed in ...

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Abstract

The embodiment of the invention discloses a non-uniformity correction method for a non-refrigeration infrared focal plane array. The non-uniformity correction method comprises the following steps of calculating correction parameters of the non-refrigeration infrared focal plane array under at least two calibrated work temperatures and storing the correction parameters in a memory; measuring the substrate temperature of the non-refrigeration infrared focal plane array; acquiring a current correction parameter corresponding to the substrate temperature from the memory according to the substrate temperature; and correcting an infrared image by using the current correction parameter. According to the non-uniformity correction method disclosed by the invention, the correction parameter of the non-refrigeration infrared focal plane array at each calibrated work temperature is stored, so that when the non-refrigeration infrared focal plane array works, one-point correction for the infrared focal plane array is not needed and the correction parameter corresponding to the current work temperature of the infrared focal plane array is directly read from the memory of the system, and an infrared imaging system is further enabled to realize continuous real-time imaging for an infrared target.

Description

Technical field [0001] The invention relates to the field of infrared imaging systems, in particular to a non-uniformity correction method of an uncooled infrared focal plane array. Background technique [0002] Infrared focal plane arrays were developed in the late 1970s and early 1980s, driven by defense applications and other strategic and tactical applications. It is an important photoelectric device for obtaining infrared heat radiation information of a scene. Infrared focal plane array is the core component of infrared imaging technology and is widely used in imaging in various fields such as military, industry, agriculture, medical treatment, and forest fire prevention. [0003] The infrared imaging system is an important part of the infrared thermal imaging system. At present, various infrared imaging systems have been widely used in communication, medical, military, industrial and other fields. [0004] The infrared focal plane array belongs to the second generation of in...

Claims

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Application Information

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IPC IPC(8): G01J5/00
Inventor 郑兴李宵马宣章翔刘子骥
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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