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Camera blemish defects detection

A defect, camera module technology, applied in the field of detecting defects in solid-state cameras, can solve problems such as serious samples and failed products

Inactive Publication Date: 2013-10-23
APPLE INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

On the other hand, in manufacturing or production line inspection, a flaw can be severe enough to cause a sample to be flagged as a failed product

Method used

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  • Camera blemish defects detection
  • Camera blemish defects detection
  • Camera blemish defects detection

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Embodiment Construction

[0012] Several embodiments of the invention and their drawings are now described. Whenever the shapes, relative positions, and other aspects of the described parts in the embodiments are not clearly defined, the scope of the present invention is not limited to only the described parts, which are for illustration purposes only. Also, having explained numerous details in detail, it should be understood that some embodiments of the invention may be practiced without these details. In some instances, well-known circuits, structures and techniques have not been described in detail in order not to obscure the understanding of the description.

[0013] One embodiment of the present invention is concerned with the process of testing a digital camera module, a consumer electronic device incorporating a digital camera module, or any other component or device having a digital camera module, such as a professional digital video or still camera. For convenience, such a component or device...

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Abstract

A digital image captured by a digital camera module is scaled to a smaller size, and separately horizontal direction filtered and vertical direction filtered using one-dimensional spatial filters. The horizontal direction filtered image and the vertical direction filtered image are combined, wherein edge regions and corner regions of the combined filtered image are created differently than its middle region. The combined filtered image is then thresholded selected pixels of the thresholded image are marked as a blemish region. Other embodiments are also described and claimed.

Description

[0001] related information [0002] This application claims priority to Provisional Patent Application No. 61 / 606844, filed March 5, 2012, entitled "Camera Blemish Defect Detection." technical field [0003] Embodiments of the present invention relate to techniques for detecting blemish defects of solid-state cameras by image processing digital images generated by the solid-state cameras. Other embodiments are also described. Background technique [0004] A camera flaw defect may be evidenced by one or more blurred spots of light seen when displaying the resulting digital image captured by the camera. Blurred spots are caused by the pixels of the digital image being different from those of the surrounding environment, even though the camera has taken an image of the flat-field-corrected target that is exactly the same. Blemish defects are usually due to scratches, smudges, or foreign objects such as dust particles, and may be located on the optical surfaces of the optical ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00G06T7/00G06T5/00
CPCG06T7/0002H04N17/002H04N17/02G06T7/0004G06T2207/10024G06T2207/30108H04N25/68
Inventor 张红勤沈诗哲I·A·麦卡里斯特
Owner APPLE INC