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A simple surface two-way reflectivity measurement bracket and measurement method

A technology of bidirectional reflection and reflectivity, applied in the field of remote sensing and spectroscopy, can solve the problems of difficulty in adapting to observation conditions and high cost, and achieve the effects of low production cost, reliable operation accuracy, and free angle adjustment.

Inactive Publication Date: 2016-01-06
NANJING XIAOZHUANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Most of the existing patented products have fixed and limited observation angles, which are difficult to adapt to various observation conditions in the field, and the cost is high. Therefore, it is necessary to design a measurement platform that can meet the accuracy requirements and is easy to manufacture and operate.

Method used

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  • A simple surface two-way reflectivity measurement bracket and measurement method
  • A simple surface two-way reflectivity measurement bracket and measurement method
  • A simple surface two-way reflectivity measurement bracket and measurement method

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Embodiment Construction

[0031] Such as figure 2 As shown, a simple surface two-way reflectivity measurement bracket and measurement method described in the embodiment of the present invention includes an angle plate, a probe arm, a probe position monitoring device and a measuring device. The angle plate includes an arc rod 1, a bottom Crossbar 2, rotating fulcrum 3 and angle fixing clip 6, the edge of the arc rod 1 is evenly marked with angle scale, the angle fixing clip 6 is fixed on the edge of the arc rod 1, and the rotating fulcrum 3 is located on the arc rod 1, the arc rod 1 is fixed above the bottom cross bar 2; the probe support arm includes an L-shaped support arm 7 and a probe box 8, and the long rod of the L-shaped support arm 7 passes through the rotation fulcrum 3 and The angle disc is connected by rotation, and the probe box 8 is installed on the short rod of the L-shaped support arm 7; the probe position monitoring device includes an adjustment rod 9, a camera 11, a horizontal bubble 1...

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Abstract

The invention relates to a simple earth surface bidirectional reflectance measurement support and a measurement method. The simple earth surface bidirectional reflectance measurement support comprises an angel scale, a probe supporting arm, a probe position monitoring device and a measurement device, wherein the angel scale comprises an arc rod, a bottom cross bar, a rotating fulcrum and an angle fixing clip, angle scale marks are evenly arranged on the edge of the arc rod, the angle fixing clip is fixed on the edge of the arc rod, the rotating fulcrum is located in the center of the arc rod, and the arc rod is fixed above the bottom cross bar; the probe supporting arm comprises a an L-shaped supporting arm and a probe box, a long rod of the L-shaped supporting arm is connected with the angle scale in a rotating mode through the rotating fulcrum, and the probe box is installed on a short rod of the L-shaped supporting arm. The simple earth surface bidirectional reflectance measurement support has the advantages that the angel scale and the probe supporting arm can rotate freely within the range of a 360-degree azimuth angle on the horizontal plane and within the range of a 180-degree observation angel on the vertical plane, angle adjustment can be achieved freely and accurately, manufacturing cost is low, operation accuracy is reliable, and the measurement support is simple and convenient and fast to use.

Description

technical field [0001] The invention relates to the fields of remote sensing and spectroscopy, in particular to a simple surface two-way reflectance measurement bracket and a measurement method. Background technique [0002] The bidirectional reflectance distribution function (BidirectionalReflectanceDistributionFunction, BRDF) represents the reflection characteristics of the object surface at any observation angle under different incident conditions. Therefore, the inversion of the spatial distribution structure of the target object can be realized by studying the BRDF. American scholar Nicodemus formally proposed the bidirectional reflectance distribution function in 1970, the formula is: [0003] [0004] In the formula (θ, φ) are the zenith angle and azimuth angle in spherical coordinates respectively, and the subscripts i and r represent the incident amount and the reflected amount respectively; dLr(θi, φi, θr, φr) is the direction of (θr, φr) The reflective lumina...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S7/481
Inventor 顾祝军刘维周张李阳吴晓霞
Owner NANJING XIAOZHUANG UNIV
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