Orthogonal standardization method and device for two-way interference signals

An interference signal and orthogonalization technology, which is applied in the field of orthogonal standardization methods and devices for two-way interference signals, can solve the problems of slow processing speed, degraded signal quality, and many processing links, and achieves fast adjustment action and prevents signal quality from deteriorating. , the effect of high frequency response
CN103630164BActive Publication Date: 2016-11-16NAT INST OF METROLOGY CHINA
4 Cites 0 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
NAT INST OF METROLOGY CHINA
Publication Date
2016-11-16

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The embodiment of the invention discloses a method and a device for orthogonal standardization of two-way interference signals. The method includes: determining the first signal to be processed and the second signal to be processed; performing DC removal processing on the first and second signals to be processed respectively to generate first and second DC removal signals; Amplitude normalization is performed on the DC signals respectively to generate first and second normalized signals; orthogonalization processing is performed on the first and second normalized signals to obtain first and second normalized signals; first and second normalized signals are obtained Orthogonalization signals are subjected to amplitude unitization processing respectively to realize orthogonal standardization of two-way interference signals. The device includes: an input unit, a direct current removal unit, a first normalization unit, an orthogonalization unit, and a second normalization unit. The method and device provided by the embodiments of the present invention adopt hardware circuits to realize the adjustment and processing of the interference signal, so the signal processing speed is fast, the frequency response is high, and the signal processing links are few, so the quality of the original signal is not easy to be reduced.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to the technical field of metrology and testing, in particular to a method and device for orthogonal standardization of two-way interference signals. Background technique

[0002] Laser interferometry refers to a measurement method that uses the principle of interference to determine related physical quantities. Laser interferometry has high measurement sensitivity and precision, and can be used for the measurement of displacement, length, angle, medium refractive index change and vibration. When performing laser interferometry, the interferometer usually first generates an interference signal; then a computer or other device calculates the measurement result based on the interference signal. The interference signal generated by the interferometer is usually a two-way interference signal, one of which may be called a first interference signal, and the other may be called a second interference signal. When calculating the measure...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More