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Orthogonal standardization method and device for two-way interference signals

An interference signal and orthogonalization technology, which is applied in the field of orthogonal standardization methods and devices for two-way interference signals, can solve the problems of slow processing speed, degraded signal quality, and many processing links, and achieves fast adjustment action and prevents signal quality from deteriorating. , the effect of high frequency response

Active Publication Date: 2016-11-16
NAT INST OF METROLOGY CHINA
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Problems solved by technology

[0005] The embodiment of the present invention provides a method and device for orthogonal normalization of two-way interference signals to solve the problems of slow processing speed and many processing links that easily lead to signal quality degradation when using existing methods to realize orthogonal normalization of two-way interference signals

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  • Orthogonal standardization method and device for two-way interference signals
  • Orthogonal standardization method and device for two-way interference signals
  • Orthogonal standardization method and device for two-way interference signals

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Embodiment Construction

[0041] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0042] see Figure 1A , is a flow chart of an embodiment of the dual-path interference signal orthogonal normalization method of the present invention, the method includes the following steps:

[0043] Step 101: Determine a first signal to be processed and a second signal to be processed according to the first interference signal and the second interference signal.

[0044] The two-way interference signal obtained from the interferometer includes two paths of a ...

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Abstract

The embodiment of the invention discloses a method and a device for orthogonal standardization of two-way interference signals. The method includes: determining the first signal to be processed and the second signal to be processed; performing DC removal processing on the first and second signals to be processed respectively to generate first and second DC removal signals; Amplitude normalization is performed on the DC signals respectively to generate first and second normalized signals; orthogonalization processing is performed on the first and second normalized signals to obtain first and second normalized signals; first and second normalized signals are obtained Orthogonalization signals are subjected to amplitude unitization processing respectively to realize orthogonal standardization of two-way interference signals. The device includes: an input unit, a direct current removal unit, a first normalization unit, an orthogonalization unit, and a second normalization unit. The method and device provided by the embodiments of the present invention adopt hardware circuits to realize the adjustment and processing of the interference signal, so the signal processing speed is fast, the frequency response is high, and the signal processing links are few, so the quality of the original signal is not easy to be reduced.

Description

technical field [0001] The invention relates to the technical field of metrology and testing, in particular to a method and device for orthogonal standardization of two-way interference signals. Background technique [0002] Laser interferometry refers to a measurement method that uses the principle of interference to determine related physical quantities. Laser interferometry has high measurement sensitivity and precision, and can be used for the measurement of displacement, length, angle, medium refractive index change and vibration. When performing laser interferometry, the interferometer usually first generates an interference signal; then a computer or other device calculates the measurement result based on the interference signal. The interference signal generated by the interferometer is usually a two-way interference signal, one of which may be called a first interference signal, and the other may be called a second interference signal. When calculating the measure...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D21/00
Inventor 高宏堂叶孝佑
Owner NAT INST OF METROLOGY CHINA
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