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Method for measuring particle size distribution of particles, and apparatus thereof

A particle size distribution and particle size technology, which is applied in the direction of measuring devices, particle and sedimentation analysis, particle size analysis, etc., can solve the problem of reducing the performance of the small particle size inversion of the algorithm, and achieve the effect of fast speed and low requirements

Inactive Publication Date: 2014-08-13
INST OF HIGH ENERGY PHYSICS CHINESE ACADEMY OF SCI
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Problems solved by technology

However, in most cases, since the form of the distribution function is unknown or multimodal, a very large error will be generated. In addition, since most algorithms are only applicable to situations where the diffraction approximation is established, the algorithm's performance is greatly reduced. Performance of Small Particle Size Inversion

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  • Method for measuring particle size distribution of particles, and apparatus thereof
  • Method for measuring particle size distribution of particles, and apparatus thereof
  • Method for measuring particle size distribution of particles, and apparatus thereof

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Embodiment Construction

[0022] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Elements and features described in one drawing or one embodiment of the present invention may be combined with elements and features shown in one or more other drawings or embodiments. It should be noted that representation and description of components and processes that are not related to the present invention and known to those of ordinary skill in the art are omitted from the drawings and descriptions for the purpose of clarity. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the ar...

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Abstract

The invention provides a method for measuring the particle size distribution of particles, and an apparatus thereof. The method for measuring the particle size distribution of particles comprises the following steps: measuring the angular distribution of the scattering light intensities of a particle group through an array detector, wherein discrete angles in the angular distribution correspond to all discrete detection pixels of the array detector; selecting a particle size interval and a sampling particle size, calculating the particle size parameter of the sampling particle size according to the particle size interval and the sampling particle size, and calculating a coefficient matrix based on a Mie scatterometer; and calculating the final particle size distribution of the particle group by using the coefficient matrix and the angular distribution as parameters of a maximum likelihood iterative inversion process. The inversion calculation of the particle size distribution of measured data with a low signal-to-noise ratio can be accurately realized in the invention.

Description

technical field [0001] The invention relates to the technical field of particle size measurement, in particular to a method and device for measuring particle size distribution. Background technique [0002] The measurement of particle size is of great significance in scientific research and engineering fields such as atmospheric science, combustion, and chemical engineering. The laser scattering particle size measurement method based on Mie scattering is currently the most widely studied technology, which maintains the unique advantages of traditional optical measurement technology, including non-contact, high precision, fast speed, and real-time performance. Modeling the particle size inverse scattering problem, the detection signal angular distribution function can be expressed as: [0003] I ( θ ) = ∫ 0 ∞ h ( r ...

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Application Information

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IPC IPC(8): G01N15/02
Inventor 杨福桂王秋实李明盛伟繁
Owner INST OF HIGH ENERGY PHYSICS CHINESE ACADEMY OF SCI
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