Method and device for controlling test of multipath signals based on PAD

Abstract

The invention discloses a method and device for controlling a test of multipath signals based on a PAD. The method comprises the following steps: arranging a multichotomous logic gate controllable circuit based on multipath signal sources, wherein the multichotomous logic gate controllable circuit is formed by combining a NOT gate, a NOR gate, a NAND gate and controllable switches; accessing multipath testing signals to the controllable switch of the multichotomous logic gate controllable circuit; controlling the multipath testing signals to be output to a pressure welding block PAD in an integrated circuit in a single direction based on a digital control source in a variable register; outputting the testing signals output in the single direction to a testing terminal by the PAD. According to the invention, the PAD layout area can be greatly reduced, the testing is more convenient, the chip investment cost and testing cost are reduced, and the testing effect is greatly improved.

Description

technical field [0001] The invention relates to the technical field of signal testing, in particular to a method and system for controlling multi-channel signal testing based on a PAD. Background technique [0002] The development and replacement cycle of integrated circuit products is relatively short. According to Moore's Law, the number of circuits integrated on an integrated chip and the performance of a microprocessor double every other cycle; the performance of a computer that can be purchased with a comparable unit of currency quadruples every other cycle. Chip manufacturers should do their best to develop new technologies and update technical standards in the shortest possible time, so as to achieve rapid optimization of product cost performance, and target large-scale consumer groups, and even prevent consumers and users from being locked in by their own technical standards. The population is lost to competing firms. [0003] In the entire R&D process of integrate...

AI Technical Summary

Problems solved by technology

[0004] Aiming at the problem that the existing PAD cannot lead out the multi-channel signal test, the present invention provides a method for controlling the multi-channel signal test based on the PAD, the PAD and the system, and the variable register is used to control the multi-channel test signal to pass through the PAD in one direction to realize multiple Test of road test signal

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