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Method of atomic absorption analysis and atomic absorption photometer

An atomic absorption and photometer technology, which is applied in the direction of material analysis, material analysis, color/spectral characteristic measurement, etc. by optical means, can solve the problems of sample scattering and inability to perform correct measurement, etc.

Active Publication Date: 2015-03-04
HITACHI HIGH-TECH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] For example, if boiling occurs during the drying stage, the sample will scatter and accurate measurement will not be possible

Method used

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  • Method of atomic absorption analysis and atomic absorption photometer
  • Method of atomic absorption analysis and atomic absorption photometer
  • Method of atomic absorption analysis and atomic absorption photometer

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Embodiment Construction

[0024] Below, refer to Figure 1 ~ Figure 4 , an embodiment of the spectrophotometer of the present invention will be described.

[0025] figure 1 It is a schematic configuration diagram of an atomic absorption photometer as a first embodiment of the present invention. exist figure 1 , the measurement light 4 is irradiated from the light source 3 to the sample 17 which is the object of measurement injected into the graphite tube 2 . The heating control part 14 controls the heating of the electric heating furnace 1 according to the heating temperature program input and set in advance in the operation part 12, the graphite tube 2 is heated by the electric heating furnace 1, and the sample 17 can be heated through the drying stage and the ashing stage. Atomized.

[0026] When heating the sample 17 , a magnetic field is applied to the sample 17 through the DC magnetic circuit 5 of the electric heating furnace 1 . The polarized light component light parallel to the magnetic fi...

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Abstract

Provided is an atomic absorption photometer with which a liquid measurement sample injected into a graphite tube is dried in a pre-measurement stage, wherein it is possible to determine whether the drying has been properly executed, and wherein a targeted measurement sensitivity and measurement reproducibility are provided with a minimum number of measurements and without many repetitions of measurement. The present invention comprises finding the absorbance of reference light, which is a component perpendicular to a magnetic field in light transmitted through a heating section, and determining there to be bumping of a sample if the duration of time where the absorbance of the reference light is greater than a predetermined value is within a predetermined duration of time; or alternatively finding the absorbance of sample light, which is a component parallel to a magnetic field in light transmitted through the heating section, and the absorbance of reference light, which is a component perpendicular to the magnetic field in light transmitted through the heating section, and determining there to be bumping of a sample if a corrected absorbance obtained by subtracting the reference light absorbance from the sample light absorbance is greater than a predetermined value.

Description

technical field [0001] The present invention relates to an atomic absorption analysis method and an atomic absorption photometer, and particularly relates to drying a measurement sample of a liquid poured into a graphite tube before measurement, evaporating water in the drying step, and burning organic matter etc. in the ashing step After ashing, it is atomized in the atomization stage, and the atomic vapor is subjected to light absorption analysis to analyze metal elements by atomic absorption analysis method and atomic absorption photometer. Background technique [0002] In the electric heating furnace analysis atomic absorption spectrometer, a measurement sample of several μL to tens of μL of liquid is injected into the graphite tube, and the ash is ashed by burning organic matter etc. In the stage of atomization, it is finally heated to the temperature at which the sample is atomized for measurement. [0003] The analysts predetermine the temperature and heating time of...

Claims

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Application Information

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IPC IPC(8): G01N21/31
CPCG01N21/3103
Inventor 户边早人石田浩康坂元秀之
Owner HITACHI HIGH-TECH CORP