Network polling and attendance management device based on OMC server

Abstract

The invention relates to the field of on-duty attendance management equipment and particularly relates to a network polling and attendance management device based on an OMC server. The network polling and attendance management device comprises a multisystem RFID reading-writing terminal and an OMC server platform, wherein the multisystem RFID reading-writing terminal is used for carrying out DT and CQT tests by polling testers and reporting the polling result and testing results to the OMC platform; the OMC platform server is used for carrying out statistics on reported polling data and data of the results of the DT and CQT tests and inquiring and exporting a polling testing statistical form. The network polling and attendance management device based on the OMC server has the beneficial effects that the terminal is simultaneously provided with a multisystem RFID reading-writing module and a wireless network testing module; by virtue of the terminal, the network testing, the maintenance and management of communication equipment assets and the management of commission maintenance polling staff can be simultaneously achieved.

Description

technical field [0001] The invention relates to the field of on-post attendance equipment, in particular to an OMC server-based network inspection and attendance management device. Background technique [0002] In recent years, with the rapid growth of 2G / 3G / WLAN network scale, the network has become more and more complex, and faults frequently occur. Traditional testing, maintenance, and management methods are inefficient, low-quality, or costly. [0003] At present, there are mainly two methods for on-site testing of wireless network quality: [0004] Use DT and CQT test instruments to test the network quality of limited key buildings or areas. The advantage is professional instrument testing, rich and accurate data. However, due to the high price of the instrument, the test cost is too high and it is difficult to promote; the test analysts have high requirements, low efficiency, and are affected by the subjectivity and responsibility of the testers. [0005] Artificial...

AI Technical Summary

Problems solved by technology

This test method is simple and fast, and has low requirements for testers, but the cost of testing is high, the sampling samples are small, and it is difficult to capture sporadic faults. Some test items rely on individual subjective judgments, and the consistency of test results is poor. Heart and skill impact and greater

[0006] It can be seen that the traditional network testing methods have certain limitations, and it is difficult to manage the quality of network testing and inspection personnel and their work

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