Fourier conversion spectrum instrument based on Michelson interferometer of equivalent intersecting mirror
A Fourier transform and interferometer technology, applied in the field of Fourier transform spectrometers, can solve problems such as unsuitability and complex components
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Publication Date
- 2015-04-01
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention is a Fourier transform spectrometer based on a Michelson interferometer, which belongs to the technical field of spectrum measuring instruments and includes aspects such as computer measurement, optoelectronic technology and interferometer system. The invention can be used for the spectral distribution of light emission or reflection of objects, and can accurately calculate the wavelength of typical characteristic spectral lines, and has wide applications in the fields of spectrum research and material analysis. Background technique
[0002] Spectrometers are increasingly important in general chemical analysis, DNA sequencing, hazardous substances in biology and chemistry, and other applications. Fourier transform spectrometers (FTS) have attracted a lot of attention in the past decade because of their specific properties, such as high accuracy, high sensitivity, and high spectral resolution.
[0003] In a traditional Fourier transform s...
Examples
example
[0054] Embedded processor 15 selects FPGA in the circuit part, and CCD signal collector 12 sampling pixels are 2 11 point, select the AD converter 14 with a resolution of 12 bits. A 531.5nm solid-state laser is used as the reference light source I1, and a 632.8nm solid-state laser is used as the measured light source II2. where the angle θ is 1.90°. After using the present invention to measure, the display shows the Fourier transform spectrum of interference fringes, as attached Figure 5 shown. The peak frequency points corresponding to the reference light and the measured light are 917 and 769, respectively. The measured light wavelength λ can be calculated by formula 12 m = 633.79nm.
[0055] At the same time, a 471.5nm solid-state laser is selected as the light source to be measured, the θ angle is 1.71°, and the measured result is 470.41nm. A 648.7nm solid-state laser is selected as the light source to be measured, the θ angle is 1.90°, and the measured result is 64...