Photoelastic modulation measurement system

Abstract

The invention provides a photoelastic modulation measurement system. A reference signal is introduced into the photoelastic modulation measurement system; the reference signal contains information of demodulation deviation of a photoelastic modulator on a polarization state; and data noise caused by the deviation of a modulation state of the photoelastic modulator is curbed through the reference signal.

Description

technical field [0001] The invention relates to the field of optical technology, in particular to a photoelastic modulation measurement system. Background technique [0002] Most crystalline materials respond differently to light of different polarization states, which is one of their important properties. Common polarized optical phenomena include linear polarization dichroism, circular polarization dichroism, linear birefringence, optical rotation, etc. These properties can be conveniently measured with photoelastic modulators combined with other polarizing elements. [0003] figure 1 It is a structural schematic diagram of a photoelastic modulation measurement system in the prior art. Such as figure 1 As shown, the polarizer generates polarized light with a fixed polarization direction. Under the action of the photoelastic modulator, the photoelastic effect of the window crystal produces high-speed polarization state modulation on the beam passing through it. The modu...

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Problems solved by technology

However, due to factors such as its inevitable mechanical vibration and static electricity accumulation, there is a deviation in the modulation of the polarization state of the incident light by the photoelastic modulator, which will be directly reflected in the measurement data, and the data with a high signal / noise ratio can only maintain 2 to 3 minutes, so that the overall experimental precision is limited to 10 -3 magnitude

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