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Stepping scanning control device and method in electromagnetic interference test receiver

A step-scan, electromagnetic interference technology, applied in the field of testing, can solve problems such as increasing test time, and achieve the effects of improving operating efficiency, efficiently interrupting processing work, and reducing control workload

Active Publication Date: 2015-04-08
CHINA ELECTRONIS TECH INSTR CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This approach can significantly increase test time if there are multiple interruptions during the scan

Method used

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  • Stepping scanning control device and method in electromagnetic interference test receiver

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Embodiment Construction

[0050] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0051] In the existing scan scheme of the electromagnetic interference test receiver, after receiving an interrupt, the CPU needs to recalculate the scan parameters and reset each circuit before the step scan process can continue. This adjustment process is completely dependent on the CPU, and the control efficiency is low. The invention discloses a step-scan control device and method in an electromagnetic interference test receiver. The interrupt processing proc...

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Abstract

The invention provides a stepping scanning control device and method in an electromagnetic interference test receiver. The stepping scanning control device comprises an adjusting parameter register/gating controller, a data source selector, a data parameter RAM (Random Access Memory), an RAM address counter, an HSCAN generator, an interrupt manager, an interrupt register and a starter. By the aid of the stepping scanning control device, an interrupt processing process which completely depended on the participation of a CPU (Central Processing Unit) before is commonly finished by the CPU and the stepping scanning control device; the CPU is only interacted with the stepping scanning control device so that the control working amount of the CPU is alleviated; meanwhile, the CPU does not need to recalculate scanning parameters so that the operation efficiency of procedures is improved; previous all relatively-dispersed modules are integrated into the semi-automatic stepping scanning control device and are matched with the CPU, so that the interrupt processing work can be efficiently finished.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a step-scan control device in an electromagnetic interference test receiver, and also relates to a step-scan control method in an electromagnetic interference test receiver. Background technique [0002] In the process of EMC certification testing, in order to obtain more accurate field strength values ​​of received signals, it is necessary for the EMI test receiver to have self-adjustment capabilities to ensure that the receiver is in the best receiving state. For this reason, EMI test receivers are required The machine can respond to internal interrupts at any time and make corresponding adjustments according to the receiver program. [0003] At present, the circuit control part, HSCAN generation part, and interrupt response part in the electromagnetic interference test receiver are relatively scattered and have no synchronous processing mechanism, and the cooperative work of e...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F13/24G01R31/00
CPCG01R31/001G06F13/24
Inventor 张志许建华杜会文王保锐周钦山
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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