A Design Method of Gaussian Even Pulse High Current High Power Broadband Injection Probe

Abstract

The invention relates to a method for designing a Gaussian even-pulse high-current and high-power broadband injection probe. The method comprises the following nine steps: (1) constructing an outer-layer metal frame of a current-injected probe in a CST microwave work room; (2) stuffing polyethylene materials of which the dielectric constant is 2 in the outer-layer metal frame; (3) constructing 5 ferrite magnetic cores which are in laminated distribution, wherein the dielectric constant of the ferrite magnetic cores is 12.7, and the initial permeability of the ferrite magnetic cores is 10,000; (4) constructing a feed port N-SMA adapter of the current-injected probe at the outer-layer metal frame; (5) constructing coils wound around the ferrite magnetic cores, wherein the number of turns of the coils is 1, and the coils are respectively connected with an N-shaped adapter center pin and the outer-layer metal frame; (6) constructing a calibration device for the current-injected probe, using an SMA current feeding mode, and setting a solving port; (7) operating a CST transient simulator, and simulating the S parameter of the current-injected probe; (8) performing the united simulation of an electromagnetic circuit in CST, and drawing a circuit diagram of the current-injected probe; (9) injecting a Gaussian even-pulse signal into a port 3, and observing the voltage-current waveform diagrams of a port 1 and a port 2.

Description

technical field [0001] The invention relates to a design method of a Gaussian even pulse high current high power broadband injection probe. The probe module will be used as an important part of the electromagnetic compatibility conduction sensitivity time-domain test system. It can inject high-current, high-power, and broadband Gaussian pulses into power lines or cables for time-domain conduction sensitivity experiments. To explore the mechanism of conduction sensitivity. It belongs to the technical field of electromagnetic compatibility conduction sensitivity. Background technique [0002] System-level testing is mainly concerned with electromagnetic compatibility issues between systems. Electromagnetic compatibility (EMC) testing is an important means to verify the rationality of electronic equipment electromagnetic compatibility design and ultimately evaluate the quality of electronic equipment. Whether the performance indicators meet the requirements. A very important...

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Problems solved by technology

The main reasons for the current lack of scientific data on the mechanism of conduction sensitivity are: 1. The existing test signals for conduction sensitivity cannot simulate the real working environment; 2. Due to the certainty of a single interference source in the frequency domain and when interference sources coexist The randomness of time in the time domain leads to limitations in frequency-domain conduction sensitivity experiments; 3. The current conduction sensitivity experiments lack the detection of nonlinearities introduced by cables

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