An automatic detection system for faults of main control combination and executive control combination in a launch control system

Abstract

An automatic detection system for faults of a main control assembly and a management control assembly in a launch control system comprises an adaptation device for the main control assembly and the management control assembly, a main control assembly automatic test program set for testing faults of the main control assembly, a management control assembly automatic test program set for testing faults of the management control assembly, and a host computer installed with the automatic test program sets, wherein the adaptation device comprises a testing single-chip microcomputer and an adapter box provided with a hardware resource switching over function. The automatic detection system has the advantages that the problem of low efficiency of conventional manual fault detection is solved; the adaptation device is adopted for providing a hardware resource, and the automatic test program sets for testing the faults of the main control assembly and the management control assembly are developed independently, so that the testing efficiency of the automatic detection system is high, and the faults can be located accurately.

Description

technical field [0001] The invention belongs to an automatic testing technology, and in particular relates to an automatic fault location technology, which is used to realize the automatic testing of a certain type of transmission control main control combination and executive control combination. Background technique [0002] The main control combination and the executive control combination have an important position in a certain type of launch control system, and are extremely important for the fault detection of the main control combination and the executive control combination. At present, for multiple similar master control combinations and executive control combinations, independent tests are used, that is, hardware is provided for each combination separately, resulting in waste of hardware resources; and the detection process requires power-on, observation of test results, and recording of test results. It consumes a lot of manpower, the detection speed is slow, and ...

AI Technical Summary

Problems solved by technology

At present, for multiple similar master control combinations and executive control combinations, independent tests are used, that is, hardware is provided for each combination separately, resulting in waste of hardware resources; and the detection process requires power-on, observation of test results, and recording of test results. It consumes a lot of manpower, the detection speed is slow, and there are also reasons for human detection, and improper detection causes damage to the product

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