A very high resolution spectral measurement device and method

Abstract

The invention discloses a very high resolution spectral measurement device and method. The spectral measurement device comprises an FP (Fluorescence Polarization) interferometer, an SBS (Stimulated Brillouin Scattering) filter, a detector, a data acquisition module and a control module, wherein a first input end of the FP interferometer is used for connecting a to-be-measured signal; a second input end of the FP interferometer is connected to a first output end of the control module; a first input end of the SBS filter is connected to an output end of the FP interferometer; a second input end of the SBS filter is connected to a second output end of the control module; an input end of the detector is connected to a first output end of the SBS filter; a first input end of the data acquisition module is connected to an output end of the detector; a second input end of the data acquisition module is connected to a second output end of the SBS filter; input and output ends of the control module are connected to output and input ends of the data acquisition module. According to the device and the method, a larger measurement range than that of the existing FP interferometer can be acquired while the spectral measurement resolution is improved.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, and more specifically relates to a very high-resolution spectral measurement device and method. Background technique [0002] Spectrum measurement plays a very important role in the field of optical communication. During the transmission of optical signals, various performance indicators can be monitored by analyzing the spectrum of optical signals. As the demand for system capacity increases, multiplexing technologies such as Orthogonal Frequency Division Multiplexing (OFDM) are gradually put into use, and the frequency interval between channels is greatly reduced, reaching the order of 10MHz. The traditional spectral measurement technology can no longer meet the resolution requirements. . On the other hand, observing details such as the relaxation oscillation effect of the laser and the chirp characteristics of the optical modulator also puts forward higher requirements for the res...

AI Technical Summary

Problems solved by technology

It is reported in the literature that the FP interferometer can obtain an accuracy of 1MHz in the experiment of measuring the frequency interval of the laser mode, but the experimental measurement range is only 10MHz to 1GHz, indicating that the FP interferometer can obtain extremely high resolution, but it is also limited by the small measurement range. limits

[0004] The book (Hui R, O'Sullivan M. Fiber optic measurement techniques[M]. Academic Press, 2009:154~168) describes the relationship between the fineness, free spectral range and bandwidth of the FP interferometer. Its advantages are It can obtain higher resolution than traditional spectrometers, but has the disadvantage of small measurement wavelength range, which limits its application

U.S. Patent No. 6,697,159B2 discloses a device for spectral measurement with an FP interferometer combined with a grating. Using the characteristics of a large measurement range but low resolution of the grating and a high resolution but small measurement range of the FP interferometer, the two are combined to obtain higher High resolution and large measurement range

The detector used to detect the light diffracted by the grating is relatively complex, and the resolution is related to the grating and the detector, and has certain limitations

Images