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Diode heat welding test bench and test method

A technology of diode and heat welding, which is applied in measuring heat, testing a single semiconductor device, using a thermometer directly sensitive to heat, electric/magnetic elements, etc., and can solve problems such as weak welding, electrical changes, and short action time of temperature and pressure, etc. problems and achieve good economic benefits

Active Publication Date: 2017-07-11
JINAN JINGHENG ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

If the temperature is too high or the pressure is too long, the chip of the diode will be easily affected by the high temperature, resulting in electrical changes. In severe cases, the diode will break down, resulting in the failure of the anti-backflow device and damage to the solar panel. cause serious consequences
If the temperature is too low or the pressure time is too short, the welding will not be firm enough to cause quality problems

Method used

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  • Diode heat welding test bench and test method
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Embodiment Construction

[0021] The present invention will be further described and defined below in conjunction with the accompanying drawings and specific embodiments.

[0022] Such as figure 1 , 2 As shown, a diode thermal welding test bench includes a heating part, a pressing part and a control part. The heating part includes a heating table 1 and a heating tube 2 located inside the heating table 1. The heating table 1 is provided with a lower fixture groove 3. The pressing part includes an upper fixture groove 4 and a moving mechanism that drives the upper fixture groove 4 to move. Both the upper fixture groove 4 and the lower fixture groove 3 are U-shaped grooves, and the upper fixture groove 4 is located at the bottom of the lower fixture groove 3. Directly above, the upper fixture groove 4 approaches or moves away from the lower fixture groove 3 under the drive of the moving mechanism. When approaching the lower fixture groove 3, the U-shaped openings of the upper and lower fixture grooves ar...

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Abstract

The invention discloses a diode heat welding test bench and a test method. The diode heat welding test bench adds a temperature control part and a pressure action time control part, which can control the temperature and pressure action time of the diode heat welding, so that the diode can operate at different temperatures Welding under the temperature and pressure action time, testing its electrical properties, and obtaining the most suitable temperature and pressure action time for diode welding. The test bench and test method of the invention can obtain the temperature and pressure action time suitable for diode thermal welding, solve a series of problems caused by diode failure caused by inaccurate welding temperature and pressure, and create good economic benefits.

Description

technical field [0001] The invention relates to a diode heat welding test bench and a diode heat welding test method based on the test bench, belonging to the technical field of diode welding. Background technique [0002] In a solar panel, in order to achieve a stable and continuous power supply, the solar energy must first be collected in the battery, and then power the electrical appliances. In the process of converting solar energy into electrical energy through the battery panel and then charging the energy storage battery, there must be a device to prevent the reverse flow of the energy storage battery. This device is very important. Its importance lies in preventing the reverse flow of the stored electric energy in the battery. solar panel. Based on this purpose, using the single-phase conductivity of the diode, solder wires with insulating layers at both ends of the diode, one end of the wire is connected to the output end of the solar panel, and the other end is co...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K7/04G01R31/26
Inventor 张禹城马根林李亚南张明张斌田龙
Owner JINAN JINGHENG ELECTRONICS