Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for calculating restoring voltage of composite wave-front sensing self-adaptation optical system

A technology of adaptive optics and wavefront restoration, applied in the field of adaptive optics, can solve problems such as underdetermined correction voltage, and achieve the effects of preventing high-order aberrations, improving closed-loop accuracy, and improving stability

Active Publication Date: 2015-12-30
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
View PDF5 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is: to overcome the deficiencies of the prior art, and propose a method for calculating the recovery voltage of the complex wavefront sensing adaptive optical system, which can overcome the low-order sensor in the complex wavefront sensing adaptive optical system The problem of underdetermined correction voltage caused by the mismatch between the number of sub-apertures and the number of deformable mirror drivers can effectively prevent the wavefront corrector from producing high-order aberrations that cannot be detected by low-order wavefront sensors, and improve system stability and closed-loop accuracy

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for calculating restoring voltage of composite wave-front sensing self-adaptation optical system
  • Method for calculating restoring voltage of composite wave-front sensing self-adaptation optical system
  • Method for calculating restoring voltage of composite wave-front sensing self-adaptation optical system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0021] A method for calculating the recovery voltage of a composite wavefront sensing adaptive optics system, when selecting a high-order wavefront sensor and a wavefront corrector to form a high-order adaptive optics system, using the direct slope wavefront restoration matrix R 0 Multiplied by the wavefront slope s measured by the higher order wavefront sensor 0 The restoration voltage v is obtained; when a low-order wavefront sensor and a wavefront corrector are selected to form a low-order adaptive optics system, the calculation of the restoration voltage v has the following steps:

[0022] Step (1), using the mode reconstruction matrix W of the low-order adaptive optics system 1 Multiplied by the wavefront slope error s measured by the low-order wavefront sensor 1 Get the wavefront error coefficient a 1 ;

[0023] Step (2), using the mo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for calculating the restoring voltage of a composite wave-front sensing self-adaptation optical system. When a high-order wave-front sensor and a wave-front corrector are selected to form a high-order self-adaptation optical system, the restoring voltage V is obtained by multiplying a direct slope wave-front restoring matrix R0 by the wave-front slope s0 measured by the high-order wave-front sensor. When a low-order wave-front sensor and the wave-front corrector are selected to form a low-order self-adaptation optical system, the restoring voltage v is calculated in the following steps that firstly, a wave-front error coefficient a1 is obtained by multiplying a mode reconstruction matrix W1 of the low-order self-adaptation optical system by a wave-front slope error s1 measured by the low-order wave-front sensor; secondly, a corresponding wave-front slope s2 of the high-order wave-front sensor under the aberration of a mode coefficient being a1 is obtained by multiplying a mode response matrix M0 of the high-order self-adaptation optical system by a1; thirdly, the restoring voltage v is obtained by multiplying the direct slope wave-front restoring matrix R0 by the wave-front slope s2. The method can effectively prevent high-order aberration which is generated by the wave-front corrector and cannot be detected by the low-order wave-front sensor, and improves system stability and closed-loop precision.

Description

technical field [0001] The invention relates to the technical field of adaptive optics, in particular to a method for calculating the recovery voltage of a composite wavefront sensing adaptive optics system. Background technique [0002] The wavefront correction capability of an adaptive optics system is affected by the measurement error of the wavefront sensor. Since the wavefront distortion of atmospheric turbulence is widely distributed in the spatial frequency domain, the higher the spatial sampling rate of the wavefront sensor is, the closer the reconstructed wavefront distortion is to reality. However, when observing extended targets, affected by the contrast of beacons (such as sunspots or rice grains), the higher the spatial sampling rate, the smaller the sub-aperture, the lower the contrast of the image in the sub-aperture, and the greater the measurement error of the wavefront slope. When observing a point source target, the higher the spatial sampling rate, the w...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J9/00G01J1/00G02B26/06G02B27/00
Inventor 饶长辉郭友明张兰强饶学军朱磊鲍华
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products