A high-performance film bulk acoustic resonator and its manufacturing method

A thin-film bulk acoustic wave and manufacturing method technology, applied in the direction of impedance network, electrical components, etc., can solve the problems of poor growth structure of the lower electrode 3, influence of FBAR frequency, and difficult process, so as to prevent device performance and long-term reliability, and improve Open circuit impedance, cost reduction effect

Active Publication Date: 2018-07-31
RDA MICROELECTRONICS SHANGHAICO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The contact stress between the substrate 1 and the lower electrode 3 of certain materials is large, which makes the growth structure of the lower electrode 3 poor, resulting in poor performance of the FBAR
[0015] Second, the upper electrode 5 is exposed in the air, which is easy to oxidize, deteriorate, etc., thereby affecting parameters such as the frequency of the FBAR
[0016] Third, in order to form the air cavity 2, a chemical mechanical grinding process is required, which is difficult and expensive

Method used

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  • A high-performance film bulk acoustic resonator and its manufacturing method
  • A high-performance film bulk acoustic resonator and its manufacturing method
  • A high-performance film bulk acoustic resonator and its manufacturing method

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Embodiment Construction

[0058] see figure 2 , which is a schematic cross-sectional view of Embodiment 1 of the FBAR of the present application. On the substrate 1 there is an isolation layer 7 protruding upwards, and the size of the isolation layer 7 is the same as that of the substrate 1 , that is, the isolation layer 7 is on the entire substrate 1 . The substrate 1 is, for example, silicon, sapphire, gallium arsenide, gallium nitride, silicon carbide, quartz, glass and other substrate materials. The isolation layer 7 is, for example, silicon oxide, silicon nitride, silicon oxynitride, aluminum nitride and other materials. There is an air cavity 2 protruding upward from the upper surface of the substrate 1 between the substrate 1 and the raised portion of the isolation layer 7 . On the isolation layer 7 there are respectively the lower electrode 3 , the piezoelectric layer 4 and the upper electrode 5 . The lower electrode 3 and the upper electrode 5 are, for example, metal materials such as alum...

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Abstract

The application discloses a high-performance FBAR (Film Bulk Acoustic Resonator), which has an upwardly raised isolation layer on the entire substrate. A raised air cavity; a lower electrode, a piezoelectric layer and an upper electrode respectively on the isolation layer; a passivation layer covering at least the entire upper electrode and / or the exposed part of the lower electrode on the upper electrode. Compared with the existing FBAR, this application changes the position of the air cavity and the manufacturing process, and also adds an isolation layer with the same size as the substrate on the substrate. This can reduce the requirements on the resistivity of the substrate material, thereby reducing the cost of the substrate; it can also improve the isolation between the substrate and the device without changing the substrate material, thereby increasing the open circuit impedance of the resonator . The present application also adds a passivation layer, which can effectively prevent the influence of the deterioration of the upper electrode and / or the lower electrode on the performance and long-term reliability of the device due to oxidation and the like.

Description

technical field [0001] The present application relates to a thin-film bulk acoustic resonator (FBAR or TFBAR, thin-film bulk acoustic resonator). Background technique [0002] FBAR is a semiconductor device that mainly includes a piezoelectric material sandwiched between two electrodes, and the three form a sandwich structure. FBAR is often used to make radio frequency filters in wireless devices such as mobile phones. The filter is composed of a group of FBARs, such as half-ladder, full-ladder, lattice, stacked ( stack) and other topological structures, which are used to filter out unwanted frequencies while allowing specific frequencies to pass. FBAR is also used to make duplexers to partially replace early surface acoustic wave (SAW, surface acoustic wave) devices. Its advantages lie in small size, advanced technology, and improved efficiency. In addition, FBAR is also used to make microwave oscillators, sensors, power amplifiers, low noise amplifiers, etc. [0003] se...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03H9/17H03H3/02
Inventor 李平胡念楚贾斌
Owner RDA MICROELECTRONICS SHANGHAICO LTD
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