Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A thermoelectric material resistivity measurement system and measurement method based on labview

A thermoelectric material and measurement system technology, applied in the direction of measuring electrical variables, measuring devices, measuring resistance/reactance/impedance, etc., can solve problems such as influence, insufficient measurement accuracy of thermoelectric material resistivity, etc., to improve accuracy and solve changes with temperature Non-linear problems, easy-to-operate effects

Inactive Publication Date: 2018-04-03
GUANGDONG UNIV OF TECH
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to solve the problem of insufficient measurement accuracy of the resistivity of thermoelectric materials and the influence of Joule heat, the present invention provides a thermoelectric material resistivity measurement system and measurement method based on LabVIEW, which can realize high-precision measurement and controllable frequency current commutation function , and has automatic measurement and friendly user interface

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A thermoelectric material resistivity measurement system and measurement method based on labview
  • A thermoelectric material resistivity measurement system and measurement method based on labview
  • A thermoelectric material resistivity measurement system and measurement method based on labview

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0035] like figure 1 As shown, a thermoelectric material resistivity measurement system based on LabVIEW includes a parameter setting module, a communication module, a data processing module and a display module; the parameter setting module is used for user input parameters, instructions and adjustment coefficients; the communication Module comprises command and parameter sending module and data accepting module; Said command and parameter sending module are used for LabVIEW to send operation instruction and operating parameter to lower computer; Described data accepting module is used for receiving the concrete data that lower computer sends; Said data The function of the processing module is to carry out algorithmic processing on the data sent by the lower computer to LabVIEW, and obtain corresponding results; the display module is used for the display of calculation results and the display of received data;

[0036] The input quantity of the parameter setting module includ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a thermoelectric material resistivity measurement system and a measurement method based on LabVIEW. The system includes a parameter setting module, a communication module, a data processing module and a display module. Among them, the parameter setting module is used for the user to input parameters, instructions and adjustment coefficients; the communication module is used for serial communication with the lower computer, sending instructions or receiving data; the data processing module is used for current conversion operation on data, and calculates the specific The resistivity; the display module is used for the display of the calculation results and the display of the received data. The present invention uses LabVIEW as the software platform, builds a friendly user interface, is easy to operate, greatly shortens the development period and saves development costs, and can collect, process and display in real time; it can effectively solve the problem that the resistivity of thermoelectric materials changes with temperature. The non-linear error can accurately measure the resistivity of the material, reduce the influence of Peltier and Seebeck effects on the measurement of the resistivity of thermoelectric materials, thereby improving the measurement accuracy of the resistivity.

Description

technical field [0001] The invention relates to the fields of measurement technology, virtual instrument technology, and performance testing of thermoelectric materials, in particular to a measurement system and method for resistivity of thermoelectric materials based on LabVIEW. Background technique [0002] Energy crisis and environmental pollution are two major problems facing social development at the present stage. Research on green renewable energy has become crucial. As one of the green renewable energy sources, the thermoelectric conversion of semiconductor thermoelectric materials has been placed high expectations. Semiconductor thermoelectric material is a new type of functional material that utilizes the movement of carriers inside a solid to realize mutual conversion of thermal energy and electrical energy. How to improve the conversion efficiency of thermoelectric materials is the key point of current research. The conversion efficiency of thermoelectric mate...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/08
Inventor 李瑜煜许伟明
Owner GUANGDONG UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com