Mutual interference rapid test method and system

Abstract

The present invention discloses a mutual interference rapid test method. The method comprises: determining the optimal sensitivity position and the polarization of the first group module of a terminal on the assigned channel of a test section, and determining the downlink power of a channel section corresponding to the assigned channel; selecting strong interference frequency points to be tested on the frequency range assigned channel to be tested according to the radiation intensity of the second module group of the terminal on the assigned channel of the frequency range to be tested; and obtaining the difference of the total omnibearing receiving sensitivity of the first module group under the interference of the second module group and the total omnibearing receiving sensitivity without the interference according to the optimal sensitivity position and the polarization of the first group module of the terminal on the assigned channel of the test section, the corresponding downlink power and the strong interference frequency points of the second module group to be tested on the frequency range assigned channel to be tested. The present invention further discloses a mutual interference rapid test system.

Description

technical field [0001] The invention relates to wireless communication technology, in particular to a method and system for quickly testing mutual interference. Background technique [0002] At present, mobile communication terminals support more and more standards, and there are more and more terminal communication forms, including not only GSM, TDS-CDMA, WCDMA, TD-LTE, LTE FDD, WLAN and other standards, but also each standard Working at the same time is becoming more and more common. This leads to multiple mutual interference scenarios when different communication systems inside the terminal work. Mutual interference is the interference of the out-of-band radiation signal of the transmission system on the reception system caused by the terminal working in two systems at the same time. The current typical mutual interference test scheme is described as follows: [0003] Such as figure 1 As shown, the communication connection between the interfered cell and the terminal ...

AI Technical Summary

Problems solved by technology

Since the terminal supports many standard and frequency band combinations, frequency combination scanning will take a lot of time and test costs are huge, making this solution impossible to apply in the actual industry

Images