Test machine and test method thereof
A testing machine and flying probe testing technology, which is applied in the field of testing machines, can solve problems such as low efficiency of circuit board testing, and achieve the effect of solving unequal efficiency
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[0051] In order to facilitate the understanding of the present invention, the testing machine and its testing method will be described more fully below with reference to the relevant drawings. The preferred embodiments of the testing machine and its testing method are given in the accompanying drawings. However, the testing machine and its testing methods can be implemented in many different forms and are not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the testing machine and its testing method more thorough and comprehensive.
[0052] It should be noted that when an element is referred to as being “fixed” to another element, it can be directly on the other element or there can also be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or intervening elements may also be present. The terms "ve...
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