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A method of automatic testing through codeoption

A technology for automated testing and test results, applied in automated test systems, electronic circuit testing, etc., can solve the problems of testers consuming huge resources and problems with the accuracy of test results, and achieve the effect of rapid automated testing

Active Publication Date: 2019-04-16
CHIPSEA TECH SHENZHEN CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The company includes a wide variety of chip models, and the parameter settings of each chip model are different, and the configuration of each model can be as high as thousands of combinations. If you rely on manual testing, it will be a huge project, and the test results There will also be problems with the accuracy of
In the past manual testing, if the chip model is added or the software code is modified, the tester needs to spend a lot of resources to repeat the test

Method used

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  • A method of automatic testing through codeoption
  • A method of automatic testing through codeoption
  • A method of automatic testing through codeoption

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Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0024] The automatic testing method realized by the present invention through CodeOption comprises the following steps:

[0025] The first step is to obtain all supported chip models and related information. The related information includes: which kinds of settings are included in each chip model, and what kinds of option values ​​are included in each setting.

[0026] Such as figure 1 As shown, all supported chip models are automatically obtained first. First obtain the ID of the IDE interface window control, and then obtain the currently supported chip model through the ID.

[0027] The speci...

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Abstract

The invention discloses an automatic test method realized through CodeOption. According to the method, all supportive chip models and relevant CodeOption are acquired, the CodeOption is compared with an accurate value, and an ID of result content is replaced by effective setting content. Through the method, all the supportive chip models are automatically acquired, combination of all settings of each chip model is automatically set, the CodeOption is lastly acquired, result statistics and analysis are carried out, and the chips can be rapidly and automatically tested through the CodeOption.

Description

technical field [0001] The invention belongs to the technical field of automated testing, in particular to an automated testing method through CodeOption. Background technique [0002] CodeOption is the chip setting parameter value, which plays a very important role in the setting and operation of the chip. The company includes a wide variety of chip models, and the parameter settings of each chip model are different, and the configuration of each model can be as high as thousands of combinations. If you rely on manual testing, it will be a huge project, and the test results Accuracy is also problematic. In the past manual testing, if the chip model is added or the software code is modified, the tester needs to spend a lot of resources to repeat the test. [0003] Therefore, how to obtain the Codeoption data generated by different chip models and the combination of all settings of each model, and count and analyze the results has become an urgent problem to be solved for C...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2834
Inventor 罗青陈元丰刘勇谢韶波
Owner CHIPSEA TECH SHENZHEN CO LTD
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