Image acquisition equipment testing method, device and system, and image acquisition equipment

Abstract

An embodiment of the invention provides an image acquisition equipment test method, device and system, and image acquisition equipment, and aims to provide a test standard scheme of the image acquisition equipment so as to quickly, effectively and objectively carry out automatic test on the image acquisition equipment. Specifically, the image acquisition equipment test method comprises the step of: acquiring a test image set obtained by the image collection equipment through the image collection of a plurality of test cards under different brightness, calculating the charge contrast corresponding to each test image in the test image set, and acquiring a test result of the image collection equipment independent of the ambient light brightness through calculation. In the testing process, thetesting conditions are loose, harsh light path conditions are not needed, and the method can be suitable for wide application scenes, is not prone to noise interference and is high in stability.

Description

technical field [0001] The present application relates to the technical field of image acquisition equipment testing, in particular, to an image acquisition equipment testing method, device, system and image acquisition equipment. Background technique [0002] In actual use, different image acquisition devices acquire different images under different conditions (such as the brightness of ambient light), which leads to the inability of existing performance indicators such as SNR (Signal Noise Ratio) to be accurate and objective. To accurately measure the performance of image acquisition equipment. How to objectively analyze these images so as to test the image acquisition quality of the image acquisition device so as to optimize the image acquisition device is particularly important for user experience. However, the existing test methods require harsh lighting conditions, and are difficult to implement in some scenarios (such as under-screen fingerprint collection scenarios)...

AI Technical Summary

Problems solved by technology

However, the existing test methods require harsh lighting conditions, and are difficult to implement in some scenarios (such as under-screen fingerprint collection scenarios), and are susceptible to noise interference. In addition, most tests require manual calculations or semi-automatic calculations with customized software. , which is inefficient and difficult to effectively test its image acquisition equipment

In short, the current lack of effective testing methods and standards makes it difficult to effectively and objectively test image acquisition equipment

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