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Chip identifier automatic checking system and method thereof

A chip identification and automatic inspection technology, applied in the direction of electrical digital data processing, instruments, internal/peripheral computer component protection, etc., can solve problems such as difficult real-time discovery, loss, and reimbursement for staff

Active Publication Date: 2019-05-17
KING YUAN ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In addition, if the number of wafers in each batch is huge, the number of chips on the wafer is even more difficult to calculate. If the chip identifier of one of the chips is wrong, it is difficult for the staff to find out in real time, which makes subsequent wafers Continue to work until the problem is discovered at the time of shipment, so that the entire batch of goods must be reimbursed, resulting in incalculable losses
[0003] Although a random serial number is added to the code of the chip identifier of some chips, this coding method still has a chance to cause repeated codes, so it still cannot completely solve the above problems

Method used

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  • Chip identifier automatic checking system and method thereof
  • Chip identifier automatic checking system and method thereof
  • Chip identifier automatic checking system and method thereof

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Embodiment Construction

[0016] figure 1 The present invention is a chip identifier automatic inspection system, an embodiment is a system architecture diagram, such as figure 1 As shown, the chip identifier automatic inspection system 1 of the present invention mainly includes a wafer probe device 5, a data acquisition device 10, a processing device 20 and a test device 30, wherein the wafer probe device 5 links the data The acquisition device 10 is connected to the processing device 20 , and the processing device 20 is connected to the testing device 30 . The wafer probe device 5 is provided with a probe set 110, a bar code reader 120, a lens 130 and a text recognition module 131. Furthermore, the data acquisition device 10 mainly includes a position record module 11, a batch number reader Get module 12, quarter number reading module 13, a random code generation module 14 and a controller 15, this controller 15 controls the operation of described module to obtain a plurality of data, and this data ...

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Abstract

The invention provides an automatic checking system for a chip identifier. The system comprises a data acquisition device, a processing device and a test device, wherein the data acquisition device is used for obtaining chip position data, wafer batch number data, chip number engraving data and a chip random code; and the processing device is provided with a coding module for coding the wafer batch number data, the chip number engraving data, the chip random code and the chip position data so as to form the chip identifier; and the test device is provided with a confirmation module for testing whether the chip identifier is normal or not. When the confirmation module finds that the chip identifier is wrong, the confirmation module transmits a stop signal to enable one probe group connected with the system to be stationary.

Description

technical field [0001] The invention relates to an automatic checking system and its method, in particular to a chip identifier automatic checking system and its method. Background technique [0002] When the current chip products leave the factory, a chip identifier will be written on each chip. At some point, the chip identifier of each chip must be unique. In other words, there cannot be repeated chip identifiers, and Therefore, in the chip manufacturing process, as long as the chip identifiers of two chips on a wafer are repeated, the wafer may have to be reimbursed accordingly. In addition, if the number of wafers in each batch is huge, the number of chips on the wafer is even more difficult to calculate. If the chip identifier of one of the chips is wrong, it is difficult for the staff to find out in real time, which makes subsequent wafers Continue to work until the problem is discovered at the time of shipment, so that the entire batch of goods must be reimbursed, r...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F21/79G06F21/73
CPCG06F21/73G06F21/79G06F2221/2153
Inventor 邱浩志
Owner KING YUAN ELECTRONICS