Radiation sensitivity test method and device under reverberation chamber conditions
A technology of radiation sensitivity and testing method, applied in the field of radiation sensitivity testing method and device, capable of solving problems such as large difference in uniform field
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Embodiment 1
[0041] figure 1 The implementation flow of the radiation sensitivity testing method provided by Embodiment 1 of the present invention is shown, and the details are as follows:
[0042] Step S101, measure the number of times the device under test is disturbed and the right-angle component of the field strength at multiple stirring positions in the reverberation chamber, and calculate the interference probability and Parameter σ.
[0043] The electric field in the reverberation chamber changes randomly according to certain statistical laws. From the perspective of electric field measurement, it is difficult to correspond the magnitude of the electric field in the reverberation chamber with that in the uniform field. However, if it is assumed that no matter what kind of field environment the device under test is in, as long as the received power of the sensitive components of the device under test is greater than its critical interference power, the device under test will be int...
Embodiment 2
[0155] Corresponding to the radiation sensitivity test method described in the first embodiment above, Figure 24 A structural block diagram of the radiation sensitivity testing device provided by Embodiment 2 of the present invention is shown. For ease of description, only the parts related to this embodiment are shown.
[0156] refer to Figure 24 , the device includes a measurement calculation module 101 , a processing module 102 and a model calculation module 103 . The measurement and calculation module 101 is used to measure the number of times the device under test is disturbed and the right-angle component of the field strength at multiple stirring positions in the reverberation chamber, and according to the number of times the device under test is disturbed and the right-angle component of the field strength, Calculate the interference probability and the parameter σ. The processing module 102 is used to calculate the wave number and the radius of the smallest spher...
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