Electronic device electromagnetic environmental effect test system and test method under electromagnetic pulse compound field environment
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- INST OF DEFENSE ENG ACADEMY OF MILITARY SCI PLA CHINA
- Publication Date
- 2019-02-19
Smart Images

Figure 1 
Figure 2 
Figure 3
Abstract
Description
technical field
[0001] The invention relates to the technical field of electromagnetic interference testing methods, in particular to a method for testing electromagnetic environment effects of electronic equipment in a low-frequency, low-impedance electromagnetic pulse composite field environment. Background technique
[0002] Due to the extreme asymmetry of the explosive environment, when a nuclear weapon explodes on the ground, its source area can produce a peak magnetic induction intensity of hundreds of gauss, a pulse duration of milliseconds, a main energy spectrum ranging from 10Hz to 100kHz, and a wave impedance less than 377Ω. Low-frequency low-impedance pulse strong magnetic field, the rise time of the electric field generated by it is 10-100ns, the half-wave width is 1ms, and the intensity is as high as 100kV / m. The electromagnetic pulse environment in the ground nuclear explosion source area has the characteristics of high intensity, high energy, low frequency, l...