The invention discloses an electronic device electromagnetic environmental effect test system and test method under an electromagnetic pulse compound field environment. A tested electronic device is fixed to a tested posture control table and placed in a uniform field test area, the tested electronic device is set to a certain working state by using an electronic device working state controller, and the tested posture control table is adjusted, a magnetic field control circuit and an electronic field control circuit are controlled to set a magnetic field amplitude value and an electronic fieldamplitude value, a magnetic field generator and an electronic field generator are subjected to linkage and trigger, and a compound field is formed to perform an irradiation effect test. The magneticfield amplitude value, the electronic field amplitude value and delaying time are continuously changed from low to high, responding phenomenon and responding signals of the tested electronic device under different interference source parameters are recorded, and effect laws are analyzed. The electronic device electromagnetic environmental effect test system and test method under the electromagnetic pulse compound field environment ensure standardization and rationality of the electromagnetic environmental effect test of the electronic device, improve accuracy of the electromagnetic environmental effect test of the electronic device, and are suitable for carrying out relative research work of an electromagnetic pulse compound field environmental effect test of a ground nuclear explosion source area.